Fermilab booster ion profile monitor system using LABVIEW

Journal Article · Fri May 05 00:00:00 EDT 1995 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.48012· OSTI ID:249327

Zagel, J R; Chen, D; Crisp, J ^[1]

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1. Fermi National Accelerator Laboratory, P.O. Box 500, Batavia, Illinois 60510 (United States)

The new Booster Ion Profile Monitor has been implemented to simultaneously capture both horizontal and vertical profiles at a once-per-turn sample rate, throughout a Booster cycle. The system uses LabVIEW software running on a MacIntosh Quadra 650 talking to both VME and CAMAC hardware. Microchannel plate voltage is turned on just prior to making a measurement and automatically turned off when the measurement is complete. This action allows using a high gain while preserving microchannel plate lifetime. The data captured may be archived for later analysis. Current analysis available include position, emittance/sigma, 2D color intensity plot of raw data, and single turn profiles for any turn during the cycle. {copyright} {ital 1995} {ital American} {ital Institute} {ital of} {ital Physics}.

• Sponsoring Organization: USDOE
• OSTI ID: 249327
• Report Number(s): CONF-9410219-; ISSN 0094-243X; TRN: 96:014294
• Journal Information: AIP Conference Proceedings, Vol. 333, Issue 1; Conference: Beam instrumentation workshop, Vancouver (Canada), 2-6 Oct 1994; Other Information: PBD: 5 May 1995
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
FERMILAB TEVATRON
BEAM MONITORING
BEAM PROFILES
GAIN
ELECTRONIC CIRCUITS
DATA ACQUISITION SYSTEMS