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Surface segregation in thin films

Journal Article · · Acta Materialia
;  [1]
  1. Univ. of Michigan, Ann Arbor, MI (United States). Dept. of Materials Science and Engineering
The authors present a theoretical analysis of the effects of thickness on surface segregation in thin films. This theory predicts surface composition as a function of the heat of segregation, temperature and film thickness. The heat of segregation can be obtained from a bulk measurement. The authors then present atomistic simulation results for segregation in thin films of different thicknesses and at different temperatures. Their theoretical results show excellent correspondence with the atomistic simulation results for all film thicknesses with no adjustable parameters, other than the bulk heat of segregation. Extensions of the theory to describe multiple layer segregation are outlined.
DOE Contract Number:
FG02-88ER45367
OSTI ID:
247958
Journal Information:
Acta Materialia, Journal Name: Acta Materialia Journal Issue: 5 Vol. 44; ISSN XZ504Y; ISSN 1359-6454
Country of Publication:
United States
Language:
English

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