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Microstructural Coarsening Kinetics and Mechanical Property Changes in Long-Term Aged Sn–Pb–Sb Solder Joints

Journal Article · · Metallography, Microstructure and Analysis
 [1];  [2];  [1];  [1];  [1]
  1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
  2. Medtronic Inc., Brooklyn Center, MN (United States)
Tin-lead-antimony (50Sn–47Pb–3Sb wt.%) soldered assemblies were mechanically tested approximately 30 years after initial production and found to have solder joints of reduced strength. The microstructure of this solder alloy exhibits a ternary eutectic structure with Sn-rich, Pb-rich, and SnSb phases. Accelerated aging was performed to evaluate solder microstructural coarsening and associated strength of laboratory solder joints to correlate these properties to the “naturally aged” solder joints. Isothermal aging was conducted at room temperature, 55, 70, 100, and 135 °C and aging times that ranged from 0.1 to 365 days. The coarsening kinetics of the Pb-rich phase were determined through optical microscopy and image analysis methods established in previous studies on binary Sn–Pb solder. A kinetic equation was developed with time exponent n of 0.43 and activation energy of 24000 J/mol, suggesting grain boundary diffusion or other fast diffusion pathways controlling the microstructural evolution. Compression testing and Vickers microhardness showed significant strength loss within the first 20–30 days after soldering; then, the microstructure and mechanical properties changed more slowly over long periods of time. Further, by combining accelerated aging data and the microstructure-based kinetics, strength predictions were made that match well with the properties of the actual soldered assemblies naturally aged for 30 years. However, aging at the highest temperature of 135 °C produced anomalous behavior suggesting that extraneous aging mechanisms are active. Therefore, data obtained at this temperature or higher should not be used. Overall, the combined microstructural and mechanical property methods used in this study confirmed that the observed reduction in strength of ~ 30-year-old solder joints can be accounted for by the microstructural coarsening that takes place during long-term solid-state aging.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
NA0003525
OSTI ID:
2475735
Report Number(s):
SAND--2024-14942J
Journal Information:
Metallography, Microstructure and Analysis, Journal Name: Metallography, Microstructure and Analysis Journal Issue: 5 Vol. 13; ISSN 2192-9262
Publisher:
SpringerCopyright Statement
Country of Publication:
United States
Language:
English

References (29)

Scanning Electron Microscopy and X-Ray Microanalysis book January 1992
The shear strength of copper and brass soldered with Sn-40% Pb containing 0 to 10% Sb and/or 0 to 15% Zn journal July 1987
Fracture mechanism of brass/Sn-Pb-Sb solder joints and the effect of production variables on the joint strength journal May 1986
The strength of brass/Sn-Pb-Sb solder joints containing 0 to 10% Sb journal January 1986
A microstructural study of the thermal fatigue failures of 60sn-40Pb solder joints journal March 1988
Formation mechanism of primary phases and eutectic structures within undercooled Pb-Sb-Sn ternary alloys journal August 2007
Investigation of microstructural coarsening in Sn-Pb alloys journal June 1999
Microstructure coarsening during static annealing of 60Sn40Pb solder joints: I stereology journal October 2001
Microstructure coarsening during static annealing of 60Sn40Pb solder joints: II eutectic coarsening kinetics journal October 2001
Microstructural Coarsening and Mechanical Properties of Eutectic Sn-58Bi Solder Joint During Aging journal October 2021
Microstructure coarsening during thermo-mechanical fatigue of Pb-Sn solder joints journal July 1997
Phase coarsening and crack growth rate during thermo-mechanical cycling of 63Sn37Pb solder joints journal August 1998
Coarsening of the Sn-Pb solder microstructure in constitutive model-based predictions of solder joint thermal mechanical fatigue journal November 1999
Microstructural coarsening in Sn-Ag-based solders and its effects on mechanical properties journal June 2009
Hardening process in ternary lead-antimony-tin alloys for battery grids journal January 1995
Interface diffusion in eutectic Pb–Sn solder journal December 1998
Aspects of coarsening in eutectic Sn–Pb journal July 2004
Computational modeling of phase separation and coarsening in solder alloys journal June 2012
Investigation of stress exponent in the room-temperature creep of Sn–40Pb–2.5Sb solder alloy journal February 2007
Automated Analysis of SEM X-Ray Spectral Images: A Powerful New Microanalysis Tool journal January 2003
Diffusion of Sn in Pb to 30 kbar journal September 1977
Extreme Fast-Diffusion System: Nickel in Single-Crystal Tin journal October 1984
A methodology to establish baseline metrics for assessing the isothermally aging of Sn‐Pb solder interconnects journal August 2002
Microstructural changes of lead‐free solder joints during long‐term ageing, thermal cycling and vibration fatigue journal February 2008
Microstructurally Based Finite Element Simulation on Solder Joint Behaviour* journal June 1997
Effect of Microstructure Size on Deformation Kinetics and Thermo-Mechanical Fatigue of 63Sn37Pb Solder Joints journal June 1996
Computer Simulation of Thermo-Mechanical Fatigue of Solder Joints Including Microstructure Coarsening journal June 1993
Impression creep of Sn–40Pb–2·5Sb peritectic solder alloy journal July 2005
Kinetics of Pb-rich Phase Particle Coarsening in Sn–Pb Solder Under Isothermal Annealing–cooling Rate Dependence journal June 2005

Figures / Tables (13)


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