Electronic angle focusing for neutron time-of-flight powder diffractometers

Von Dreele, Robert B.

doi:10.1107/s1600576724008756

Electronic angle focusing for neutron time-of-flight powder diffractometers

Journal Article · Tue Oct 01 00:00:00 EDT 2024 · Journal of Applied Crystallography

DOI:https://doi.org/10.1107/s1600576724008756· OSTI ID:2449666

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Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)

A neutron time-of-flight (TOF) powder diffractometer with a continuous wide-angle array of detectors can be electronically focused to make a single pseudo-constant wavelength diffraction pattern, thus facilitating angle-dependent intensity corrections. The resulting powder diffraction peak profiles are affected by the neutron source emission profile and resemble the function currently used for TOF diffraction.

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Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF)

Grant/Contract Number:: AC02-06CH11357

OSTI ID:: 2449666

Alternate ID(s):: OSTI ID: 2997153

Journal Information:: Journal of Applied Crystallography, Journal Name: Journal of Applied Crystallography Journal Issue: 5 Vol. 57; ISSN 1600-5767

Publisher:: International Union of Crystallography (IUCr)Copyright Statement

Country of Publication:: United States

Language:: English

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Electronic angle focusing for neutron time-of-flight powder diffractometers

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