Roles of temperature, materials, and domain inversion in high-performance, low-bias-drift thin film lithium niobate blue light modulators

Celik, Oguz Tolga; Yousry Ammar, Nancy; Park, Taewon; Stokowski, Hubert S.; Multani, Kevin K. S.; Hwang, Alexander Y.; Gyger, Samuel; Guo, Yudan; Fejer, Martin M.; Safavi-Naeini, Amir H.

doi:10.1364/OE.538150

Roles of temperature, materials, and domain inversion in high-performance, low-bias-drift thin film lithium niobate blue light modulators

Journal Article · Mon Sep 23 00:00:00 EDT 2024 · Optics Express

DOI:https://doi.org/10.1364/OE.538150· OSTI ID:2447646

; ; Park, Taewon; ; Multani, Kevin K. S.; ; ; Guo, Yudan; Fejer, Martin M.;

We demonstrate a thin film lithium niobate electro-optic modulator operating at 456 nm with an RF voltage-length product of 0.38 V-cm and a bandwidth of 6.9 GHz. We test the dielectric relaxation of the modulator with sweeps of temperature and optical input power, and compare equivalent modulators with electrode materials of Cr-Au, Ti-Au and Al in terms of bias stability and current-voltage characteristics. We demonstrate bias stability over at least 8 hours with Al devices, and show relationships between drift, I-V characteristics and ferroelectric domain switching.

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Sponsoring Organization:: USDOE

Grant/Contract Number:: AC02-76SF00515

OSTI ID:: 2447646

Journal Information:: Optics Express, Journal Name: Optics Express Journal Issue: 21 Vol. 32; ISSN 1094-4087; ISSN OPEXFF

Publisher:: Optical Society of AmericaCopyright Statement

Country of Publication:: United States

Language:: English

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