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Measuring the Electronic Bandgap of Carbon Nanotube Networks in Non-Ideal p-n Diodes

Journal Article · · Materials
DOI:https://doi.org/10.3390/ma17153676· OSTI ID:2437672
 [1];  [1];  [1];  [2];  [1]
  1. State Univ. of New York (SUNY), Albany, NY (United States)
  2. National Renewable Energy Laboratory (NREL), Golden, CO (United States)
The measurement of the electronic bandgap and exciton binding energy in quasi-one-dimensional materials such as carbon nanotubes is challenging due to many-body effects and strong electron–electron interactions. Unlike bulk semiconductors, where the electronic bandgap is well known, the optical resonance in low-dimensional semiconductors is dominated by excitons, making their electronic bandgap more difficult to measure. In this work, we measure the electronic bandgap of networks of polymer-wrapped semiconducting single-walled carbon nanotubes (s-SWCNTs) using non-ideal p-n diodes. We show that our s-SWCNT networks have a short minority carrier lifetime due to the presence of interface trap states, making the diodes non-ideal. We use the generation and recombination leakage currents from these non-ideal diodes to measure the electronic bandgap and excitonic levels of different polymer-wrapped s-SWCNTs with varying diameters: arc discharge (~1.55 nm), (7,5) (0.83 nm), and (6,5) (0.76 nm). Our values are consistent with theoretical predictions, providing insight into the fundamental properties of networks of s-SWCNTs. The techniques outlined here demonstrate a robust strategy that can be applied to measuring the electronic bandgaps and exciton binding energies of a broad variety of nanoscale and quantum-confined semiconductors, including the most modern nanoscale transistors that rely on nanowire geometries.
Research Organization:
National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Sponsoring Organization:
US Office of Naval Research (ONR); USDOE Office of Science (SC), Basic Energy Sciences (BES). Chemical Sciences, Geosciences & Biosciences Division
Grant/Contract Number:
AC36-08GO28308
OSTI ID:
2437672
Report Number(s):
NREL/JA--5K00-84620; MainId:85393; UUID:51a7c3c4-cae4-418b-b094-a3ed7cf7f073; MainAdminId:73441
Journal Information:
Materials, Journal Name: Materials Journal Issue: 15 Vol. 17; ISSN 1996-1944
Publisher:
MDPICopyright Statement
Country of Publication:
United States
Language:
English

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