Gate insertions scale noise tractably for zero noise extrapolation on a trapped ion device

Conference · Tue Feb 28 23:00:00 EST 2023

DOI:https://doi.org/10.2172/2431756· OSTI ID:2431756

Maupin, Oliver ^[1]; Love, Peter J. ^[1]; Burch, Ashlyn Damaris ^[2]; Landahl, Andrew J. ^[2]; Clark, Susan M. ^[2]

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1. Tufts University
2. Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: Advanced Scientific Computing Research
• DOE Contract Number: NA0003525
• OSTI ID: 2431756
• Report Number(s): SAND2023-00271C
• Country of Publication: United States
• Language: English