Near‐field Imaging of Optical Resonance Modes in Silicon Metasurfaces Using Photoelectron Microscopy

Conference · Mon May 01 00:00:00 EDT 2023

DOI:https://doi.org/10.2172/2431276· OSTI ID:2431276

Boehm, Alexander Matthew ^[1]; Doiron, Chloe Florence ^[1]; Brener, Igal ^[1]; Sarma, Raktim ^[1]; Ohta, Taisuke ^[1]

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1. Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: Basic Energy Sciences
• DOE Contract Number: NA0003525
• OSTI ID: 2431276
• Report Number(s): SAND2023-03550C
• Country of Publication: United States
• Language: English