Application of Thévenin equivalent sensitivity equations for reliable voltage stability assessment

Osipov, Denis; Ferreira, Alan P.F.; Chow, Joe H.; Taranto, Glauco N.; Assis, Tatiana M.L.

doi:10.1016/j.epsr.2022.108424

Application of Thévenin equivalent sensitivity equations for reliable voltage stability assessment

Journal Article · Thu Jul 21 00:00:00 EDT 2022 · Electric Power Systems Research

DOI:https://doi.org/10.1016/j.epsr.2022.108424· OSTI ID:2424385

^[1]; ^[2]; Chow, Joe H. ^[1]; Taranto, Glauco N. ^[3]; ^[3]

Rensselaer Polytechnic Institute, Troy, NY (United States)
Federal Center for Technological Education – CEFET/RJ, Rio de Janeiro (Brazil); Federal University of Rio de Janeiro - COPPE (Brazil)
Federal University of Rio de Janeiro - COPPE (Brazil)

In this paper, sensitivity equations for the Thévenin equivalent parameters, voltage and reactance, are derived using the duality between the Thévenin parameters from two consecutive PMU measurements. Using the sensitivity equation for the Thévenin reactance, a robust adaptive X-Th algorithm is developed aiming to extend a well-known adaptive E-Th approach by being able to accurately estimate the parameters for a wider range of loading conditions. In the performed case studies the resulting accuracy is evaluated when estimating the Thévenin parameters for large disturbances, for two sides with respect to a boundary bus, accommodating sensitivity to topology changes and nonlinearities in power systems. In conclusion, the results can be used for accurate voltage stability assessment using the Thévenin parameters.

View Accepted Manuscript (DOE)

Research Organization:: Rensselaer Polytechnic Institute, Troy, NY (United States)

Sponsoring Organization:: USDOE; National Science Foundation (NSF)

OSTI ID:: 2424385

Journal Information:: Electric Power Systems Research, Journal Name: Electric Power Systems Research Vol. 211; ISSN 0378-7796

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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