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Programming twist angle and strain profiles in 2D materials

Journal Article · · Science
 [1];  [2];  [2];  [2];  [3];  [4];  [2];  [4];  [4];  [2];  [5];  [5];  [5];  [6];  [6];  [7];  [7];  [5];  [3];  [4] more »;  [2];  [4];  [2] « less
  1. Department of Physics, Columbia University, New York, NY, USA.; OSTI
  2. Department of Physics, Columbia University, New York, NY, USA.
  3. Center for Nanostructured Graphene, Technical University of Denmark, DK-2800, Denmark.; DTU Physics, Technical University of Denmark, DK-2800, Denmark.
  4. Department of Mechanical Engineering, Columbia University, New York, NY, USA.
  5. Department of Physics and Astronomy, Aarhus University, 8000 Aarhus C, Denmark.
  6. Synchrotron SOLEIL, Université Paris-Saclay, F-91192 Gif sur Yvette, France.
  7. National Institute for Materials Science, 1-1 Namiki, Tsukuba, 305-0044, Japan.

Moiré superlattices in twisted two-dimensional materials have generated tremendous excitement as a platform for achieving quantum properties on demand. However, the moiré pattern is highly sensitive to the interlayer atomic registry, and current assembly techniques suffer from imprecise control of the average twist angle, spatial inhomogeneity in the local twist angle, and distortions caused by random strain. We manipulated the moiré patterns in hetero- and homobilayers through in-plane bending of monolayer ribbons, using the tip of an atomic force microscope. This technique achieves continuous variation of twist angles with improved twist-angle homogeneity and reduced random strain, resulting in moiré patterns with tunable wavelength and ultralow disorder. Our results may enable detailed studies of ultralow-disorder moiré systems and the realization of precise strain-engineered devices.

Research Organization:
Columbia Univ., New York, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
DOE Contract Number:
SC0019443
OSTI ID:
2421308
Journal Information:
Science, Journal Name: Science Journal Issue: 6658 Vol. 381; ISSN 0036-8075
Publisher:
AAAS
Country of Publication:
United States
Language:
English

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