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Extreme ultraviolet transient gratings: A tool for nanoscale photoacoustics

Journal Article · · Photoacoustics
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  1. Elettra-Sincrotrone Trieste (Italy); OSTI
  2. Elettra-Sincrotrone Trieste (Italy)
  3. Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
  4. Univ. of Trento (Italy)
  5. Univ. of Amsterdam (Netherlands)
  6. Università di Padova (Italy)
  7. Università Cattolica del Sacro Cuore, Brescia (Italy)
  8. Elettra-Sincrotrone Trieste (Italy); Ca’ Foscari University of Venice (Italy)
  9. Istituto Italiano di Tecnologia, Genoa (Italy)
  10. Università di Camerino (Italy); Istituto Nazionale di Fisica Nucleare (INFN), Perugia (Italy)
  11. Elettra-Sincrotrone Trieste (Italy); Ca’ Foscari University of Venice (Italy); European Synchrotron Radiation Facility (ESRF), Grenoble (France)

Collective lattice dynamics determine essential aspects of condensed matter, such as elastic and thermal properties. These exhibit strong dependence on the length-scale, reflecting the marked wavevector dependence of lattice excitations. The extreme ultraviolet transient grating (EUV TG) approach has demonstrated the potential of accessing a wavevector range corresponding to the 10s of nm length-scale, representing a spatial scale of the highest relevance for fundamental physics and forefront technology, previously inaccessible by optical TG and other inelastic scattering methods. In this manuscript we report on the capabilities of this technique in the context of probing thermoelastic properties of matter, both in the bulk and at the surface, as well as discussing future developments and practical considerations.

Research Organization:
Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); Netherlands Organization for Scientific Research (NWO)
Grant/Contract Number:
SC0019126
OSTI ID:
2420972
Journal Information:
Photoacoustics, Journal Name: Photoacoustics Journal Issue: C Vol. 29; ISSN 2213-5979
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English

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