Testing Low-Loss Microstrip Materials with MKIDs for Microwave Applications
Journal Article
·
· Journal of Low Temperature Physics
- Vanderbilt Univ., Nashville, TN (United States); Univ. of Chicago, IL (United States)
- Univ. of Chicago, IL (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Univ. of Chicago, IL (United States)
Future measurements of the millimeter-wavelength sky require a low-loss superconducting microstrip, typically made from niobium and silicon-nitride, coupling the antenna to detectors. Here, we propose a simple device for characterizing these low-loss microstrips at 150 GHz. In our device we illuminate an antenna with a thermal source and compare the measured power at 150 GHz transmitted down microstrips of different lengths. The power measurement is made using Microwave Kinetic Inductance Detectors (MKIDs) fabricated directly onto the microstrip dielectric, and comparing the measured response provides a direct measurement of the microstrip loss. Our proposed structure provides a simple device (4 layers and a DRIE etch) for characterizing the dielectric loss of various microstrip materials and substrates. We present initial results using these devices. We demonstrate that the millimeter wavelength loss of microstrip lines, a few tens of millimeters long, can be measured using a practical aluminum MKID with a black body source at a few tens of Kelvin.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF); USDOE Office of Science (SC), High Energy Physics (HEP)
- Grant/Contract Number:
- AC02-06CH11357
- OSTI ID:
- 2329399
- Journal Information:
- Journal of Low Temperature Physics, Journal Name: Journal of Low Temperature Physics Journal Issue: 5-6 Vol. 209; ISSN 0022-2291
- Publisher:
- Springer NatureCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Similar Records
Measurement of Dielectric Loss in Silicon Nitride at Centimeter and Millimeter Wavelengths
Low Loss Superconducting Microstrip Development at Argonne National Lab
Development of Multi-chroic MKIDs for Next-Generation CMB Polarization Studies
Conference
·
Tue Aug 01 00:00:00 EDT 2023
·
OSTI ID:2426622
Low Loss Superconducting Microstrip Development at Argonne National Lab
Journal Article
·
Wed Nov 19 19:00:00 EST 2014
· IEEE Transactions on Applied Superconductivity
·
OSTI ID:1357457
Development of Multi-chroic MKIDs for Next-Generation CMB Polarization Studies
Journal Article
·
Wed Nov 14 23:00:00 EST 2018
· Journal of Low Temperature Physics
·
OSTI ID:22809843