Electrochemistry and langmuir trough studies of C{sub 60} and C{sub 70} films

Journal Article · Wed May 20 04:00:00 EDT 1992 · Journal of the American Chemical Society

DOI:https://doi.org/10.1021/ja00037a030· OSTI ID:232211

Jehoulet, C; Obeng, Y S; Kim, Y T ^[1]

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1. Univ. of Texas, Austin, TX (United States); and others

Thin films of the fullerenes C{sub 60} and C{sub 70}, formed by solution casting, were studied by cyclic voltammetry (CV) in MeCN solutions containing quaternary ammonium or alkali-metal salts as supporting electrolytes. The film shows four CV reduction waves and one oxidation wave. The CV behavior for the first reduction, coulometrically equivalent to a one-electron reduction, indicates a large structural reorganization of the film with intercalation of the supporting electrolyte cation and a small amount of dissolution. Upon oxidation of the reduced form, the structure rearranges to form the parent. Similar effects occur for the second reduction/reoxidation process. The size of the cations affects the nature of these CV waves. Scanning electrochemical microscopy (SECM) of the C{sub 60} films indicates that neither the C{sub 60} film nor the completely reduced, C{sub 60}{sup -}, form is a good electronic conductor, while a partially reduced film displays enhanced conductivity. Langmuir trough studies of C{sub 60} and C{sub 70} show the preparation of highly incompressible monolayer and multilayer films at the air/water interface. Mixed films of the fullerenes with the surfactant arachidic acid can also be prepared. 42 refs., 18 figs., 1 tab.

• Sponsoring Organization: USDOE
• OSTI ID: 232211
• Journal Information: Journal of the American Chemical Society, Journal Name: Journal of the American Chemical Society Journal Issue: 11 Vol. 114; ISSN JACSAT; ISSN 0002-7863
• Country of Publication: United States
• Language: English

Related Subjects

40 CHEMISTRY
FILMS
FULLERENES
VOLTAMETRY