High Power Test Results For A Cylindrical-Shell SiC Higher-Order-Mode DAMPER

Technical Report · Tue Feb 27 04:00:00 EST 2024

DOI:https://doi.org/10.2172/2315627· OSTI ID:2315627

Xu, Wencan ^[1]; Conway, Z. A. ^[1]; Daly, E. ^[2]; Guo, J. ^[2]; Hernandez, K. ^[1]; Holmes, D. ^[1]; Rimmer, R. A. ^[2]; Severino, F. ^[1]; Smith, K. ^[1]; Weiss, D. ^[1]; Zaltsman, A. ^[1]

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1. Brookhaven National Laboratory (BNL), Upton, NY (United States)
2. Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)

The next high-current Electron Ion Collider (EIC) is a new accelerator to be built at Brookhaven National Laboratory (BNL) in collaboration with Thomas Jefferson National Accelerator Facility (TJNAF). In the EIC Electron Storage Ring (ESR), there will be beam currents up to 2.5 A, which will excite massive Higher-Order-Modes (HOM) power in the 17 single-cell 591 MHz Superconducting Radio Frequency (SRF) cavities. To damp the HOM power in the ESR SRF cavities is a challenge. A room temperature cylindrical shell shape Silicon Carbide (SiC) Beamline HOM Absorber (BLA) was chosen as the baseline design, due to its broadband and high-power capability, and previous demonstrations at other accelerator facilities, albeit at much lower power. Because the EIC BLA HOM power dissipation is significantly greater than the previous applications, it is imperative to carry out high power testing to determine the maximum device performance levels achievable for thermal transport, RF breakdown, and mechanical stress, prior to finalizing the design. A SiC HOM absorber with state-of-the-art geometry size was prototyped to verify shrink-fit technique, test outgassing rate, and high power handling capability. This paper presents the HOM damper’s prototyping and test results.

• Research Organization: Brookhaven National Laboratory (BNL), Upton, NY (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Nuclear Physics (NP)
• DOE Contract Number: SC0012704
• OSTI ID: 2315627
• Report Number(s): BNL--225351-2024-TECH
• Country of Publication: United States
• Language: English

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