Tribological performance of diamond and diamondlike carbon films at elevated temperatures
In this study, we investigated the tribological performance of diamond and diamondlike carbon (DLC) films as a function of ambient temperature. Both films were deposited on silicon carbide (SiC) by microwave plasma chemical vapor deposition and ion-beam deposition processes. Tribological tests were performed on a reciprocating wear machine in open air (20 to 30% relative humidity) and under a 10-N load using SiC pins. For the test conditions explored, the steady- state friction coefficients of test pairs without a diamond or DLC film were 0.7 to 0.9 and the average wear rates of pins were 10{sup {minus}5} to 10{sup {minus}7} mm{sup 3}/N.m, depending on ambient temperature. DLC films reduced the steady-state friction coefficients of test pairs by factors of 3 to 5 and the wear rates of pins by two to three orders of magnitude. Low friction coefficients were also obtained with the diamond films, but wear rates of the counterface pins were high due to the very abrasive nature of these films. The wear of SiC disks coated with either diamond or DLC films was virtually unmeasurable while the wear of uncoated disks was substantial. Test results showed that the DLC films could afford low friction up to about 300{degrees}C. At higher temperatures, the DLC films became graphitized and were removed from the surface. The diamond films could withstand much higher temperatures, but their tribological behavior degraded. Raman spectroscopy and scanning electron microscopy were used to elucidate the friction and wear mechanisms of both films at high temperatures.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-31-109-ENG-38
- OSTI ID:
- 230603
- Report Number(s):
- ANL/ET/CP-87838; CONF-960501-1; ON: DE96009039
- Resource Relation:
- Conference: Annual meeting of the Society of Tribologists and Lubrication Engineers, Cincinnati, OH (United States), 20-23 May 1996; Other Information: PBD: Sep 1995
- Country of Publication:
- United States
- Language:
- English
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