Planar waveguide structures based on SrF{sub 2}: Ho, Er, Tm. Dependence of the refractive index on the dopant concentration
Journal Article
·
· Quantum Electronics (Woodbury, N.Y.)
Refractive indices of SrF{sub 2} crystals doped with holmium, erbium, and thulium ions are measured. These crystals are used as active laser media, in particular, as materials for planar waveguides. The presence of active ions in these crystals may create a difference between the refractive indices of the cladding and the doped core of a planar waveguide. At dopant concentration to 4 %, the difference Δn between the refractive indices of the doped core and undoped reflective layer can reach 0.007.
- OSTI ID:
- 23004801
- Journal Information:
- Quantum Electronics (Woodbury, N.Y.), Vol. 48, Issue 9; Other Information: Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7818
- Country of Publication:
- United States
- Language:
- English
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