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Defectoscopy of ZnGeP{sub 2} single crystals using a strontium vapour laser

Journal Article · · Quantum Electronics (Woodbury, N.Y.)
DOI:https://doi.org/10.1070/QEL16507· OSTI ID:23000277
A modified method of optical defectoscopy of ZnGeP{sub 2} single crystal plates using a strontium vapour laser (λ = 1.03 and 1.09 μm) is proposed based on shadow imaging of internal defects in plates cut parallel to the (100) plane. It is shown that the use of a strontium vapour laser with a wavelength of 6.45 mm makes it possible to study inhomogeneities in large-size ZnGeP{sub 2} samples. The possibility of fabricating a projection defectoscope for monitoring breakdown development in ZnGeP{sub 2} crystals is considered. (laser applications)
OSTI ID:
23000277
Journal Information:
Quantum Electronics (Woodbury, N.Y.), Journal Name: Quantum Electronics (Woodbury, N.Y.) Journal Issue: 5 Vol. 48; ISSN 1063-7818; ISSN QUELEZ
Country of Publication:
United States
Language:
English

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