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Title: Left ventricular mechanical dyssynchrony assessment in long-standing type II diabetes mellitus patients with normal gated SPECT-MPI

Journal Article · · Journal of Nuclear Cardiology (Online)
; ; ; ;  [1];  [2]
  1. Postgraduate Institute of Medical Education and Research (PGIMER), Department of Nuclear Medicine (India)
  2. Postgraduate Institute of Medical Education and Research (PGIMER), Department of Cardiology (India)

Background: Assessment of left ventricular mechanical dyssynchrony (LVMD) using phase analysis of gated SPECT-MPI is well established. However, there is little information about the influence of diabetes mellitus on phase analysis. The present work was to evaluate the LVMD in longstanding type II diabetes mellitus (DM) patients with normal gated SPECT-MPI. Methods: Retrospective analysis of 146 (86 type II diabetics for > 5 years’ duration and 60 nondiabetics) consecutive patients with normal gated SPECT-MPI and adequate LVEF was done. Sixty age- and sex-matched nondiabetic served as control. LVMD was determined from the cutoff values (> mean + 2 SD) observed for phase standard deviation (PSD) and phase bandwidth (PBW) from the control subjects. Multivariate logistic regression analysis was applied to assess the correlation between various confounding factors. Results: LVMD was detected in 24 (28%) diabetic patients with the pre-defined cut-off values for PSD (> 10.8) and PBW (> 35.6) derived from the controls. Hyperlipidemia, overweight/obesity, duration of DM and its long-term complications were independently associated with LVMD, with long-term complications being the highest risk factor (OR 28.00; P < .001). Conclusion: The evolution time of the patients with type II diabetes mellitus affects the left ventricular mechanical synchrony.

OSTI ID:
22961962
Journal Information:
Journal of Nuclear Cardiology (Online), Vol. 26, Issue 5; Other Information: Copyright (c) 2019 American Society of Nuclear Cardiology; Country of input: International Atomic Energy Agency (IAEA); ISSN 1532-6551
Country of Publication:
United States
Language:
English