In situ mechanical characterization of a single cell-cell adhesion interface under large strain
Patent
·
OSTI ID:2293996
A method of measuring a stress-strain curve in a cell-cell adhesion interface, the method including: providing a structure including a first movable island supported by a first beam, a second movable island supported by a second beam, and a gap therebetween connected by a pair of cells forming a junction, the pair of cells comprising a cell-cell adhesion interface having an initial length defined by a distance between nuclei of the pair of cells; moving the second movable island with a defined displacement; determining a displacement of the first movable island based on moving the second movable island; calculating a difference between the displacement of the first movable island and the defined displacement of the second movable island based on moving the second movable island; determining an applied strain in the cell-cell adhesion interface between the pair of cells based on the difference divided by the initial length of the cell-cell adhesion interface; calculating a force between the cell-cell adhesion interface of the pair of cells based on the displacement of the first movable island; calculating a stress in the cell-cell adhesion interface between the pair of cells based on the force; and determining the stress-strain curve of the cell-cell adhesion interface between the pair of cells by plotting the calculated stress against the applied strain.
- Research Organization:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States); NUtech Ventures, Lincoln, NE (United States)
- Sponsoring Organization:
- USDOE; National Institutes of Health (NIH); National Science Foundation (NSF)
- DOE Contract Number:
- AC05-00OR22725
- Assignee:
- NUtech Ventures (Lincoln, NE); UT-Battelle, LLC (Oak Ridge, TN)
- Patent Number(s):
- 11,846,611
- Application Number:
- 17/473,090
- OSTI ID:
- 2293996
- Country of Publication:
- United States
- Language:
- English
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