Microphase Separation in Poly(Imide Siloxane) Copolymer

Journal Article · Mon Jul 15 04:00:00 EDT 2019 · Physics of the Solid State

DOI:https://doi.org/10.1134/S1063783419070205· OSTI ID:22925196

Martynenkov, A. A. ^[1]

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1. Institute of Macromolecular Compounds, Russian Academy of Sciences (Russian Federation)

The comparative analysis of microheterogeneous structure of the surface of films of amorphous aromatic polyetherimide: poly[4, 4'-bis(4''-N-phenoxy)diphenylsulfon]imide of 1,3-bis(3', 4-dicarboxyphenoxy)benzene (PEI) and poly(imide siloxane) block copolymer (PSI) containing PEI blocks and blocks of dimethylsiloxane units was performed according to electron microscopy. It was shown that anisotropy, long-range order, and the correlation length of density fluctuations increase in PSI film as compared to PEI. PSI samples are characterized by asymmetrical biaxial surface texture, as opposed to PEI, which exhibits axial texture. Periodic density oscillations are observed along the directions of axes of PSI structure at the micron scale. The obtained results evidence microphase separation in PSI film caused by spatially oriented contact interactions between the blocks of dimethylsiloxane units.

• OSTI ID: 22925196
• Journal Information: Physics of the Solid State, Journal Name: Physics of the Solid State Journal Issue: 7 Vol. 61; ISSN 1063-7834
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANISOTROPY
COPOLYMERS
DENSITY
ELECTRON MICROSCOPY
IMIDES
INTERACTIONS
OSCILLATIONS
SILOXANES
SURFACE PROPERTIES
THIN FILMS