Structural, Optical, and Dielectric Studies on Sr-Doped Biferroic YCrO{sub 3}

Journal Article · Thu Aug 15 00:00:00 EDT 2019 · Journal of Superconductivity and Novel Magnetism

DOI:https://doi.org/10.1007/S10948-018-4979-Y· OSTI ID:22922953

Tiwari, S.; Mishra, A.; Varshney, D. ^[1]

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1. Devi Ahilya University, Materials Science Laboratory, School of Physics, Vigyan Bhawan (India)

In this work, the solid-state synthesis of Y{sub 1-x}Sr{sub x}CrO{sub 3} (x = 0.0, 0.1) samples has been reported. The X-ray diffraction data analysis confirmed that the synthesized samples have crystallized into the orthorhombic phase with the assigned space group Pbnm. The Rietveld refinement of the XRD data confirmed the structure and other related parameters. The slight variation in the lattice parameters and negligible shift in the reflection peaks reveals the uniform dispersion of Sr at Y-site in the parent YCrO{sub 3} matrix. The dielectric characterization revealed the good dielectric nature of the prepared samples which decreases with Sr doping. Field emission scanning electron microscopy (FE-SEM) revealed that an agglomeration type process has taken place in the sample preparation. Fourier transform infrared (FTIR) characterization witnessed the formation of orthorhombic phase of the samples under study displaying sharp absorption bands corresponding to Cr–O stretching, Y/Sr–O stretching, and O–Cr–O deformation vibration, respectively. UV-Vis spectroscopy analysis revealed the dual direct allowed bandgap of the samples assigned to the Cr{sup 3+} ion transition in the ground level.

• OSTI ID: 22922953
• Journal Information: Journal of Superconductivity and Novel Magnetism, Vol. 32, Issue 8; Other Information: Copyright (c) 2019 Springer Science+Business Media, LLC, part of Springer Nature; Country of input: International Atomic Energy Agency (IAEA); ISSN 1557-1939
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
77 NANOSCIENCE AND NANOTECHNOLOGY
CHROMATES
DEFORMATION
DIELECTRIC MATERIALS
DIELECTRIC PROPERTIES
DISPERSIONS
DOPED MATERIALS
FIELD EMISSION
FOURIER TRANSFORMATION
GROUND LEVEL
INFRARED SPECTRA
LATTICE PARAMETERS
NANOPARTICLES
ORTHORHOMBIC LATTICES
SCANNING ELECTRON MICROSCOPY
SPACE GROUPS
SPECTROSCOPY
STRONTIUM ADDITIONS
SYNTHESIS
X-RAY DIFFRACTION
YTTRIUM COMPOUNDS