XAFS Spectroscopy Study of Microstructure and Electronic Structure of Heterosystems Containing Si/GeMn Quantum Dots
- Nikolaev Institute of Inorganic Chemistry, Siberian Branch, Russian Academy of Sciences (Russian Federation)
- Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences (Russian Federation)
- Rossendorf Beamline at the ESRF (France)
- Helmholtz-Zentrum Dresden-Rossendorf (HZDR), Institute of Ion Beam Physics and Materials Research (Germany)
Using X-ray absorption near edge structure spectroscopy, extended X-ray absorption fine structure spectroscopy, atomic force microscopy, and Rutherford backscattering spectroscopy, the features of the microstructure and elemental composition of Si/GeMn magnetic systems obtained by molecular beam epitaxy and containing quantum dots are studied. Intense mixing of Ge and Si atoms is found in all samples. The degree of mixing (diffusion) correlates with the conditions of synthesis of Si/GeMn samples. For these systems, direct contacts of germanium atoms with manganese atoms are characterized and the presence of interstitial manganese with tetrahedral coordination and substitution of manganese for germanium and silicon in the lattice sites is found. The presence of stoichiometric phases Ge{sub 8}Mn{sub 11}, Ge{sub 3}Mn{sub 5} is not detected. The correlations of the Ge, Si, and Mn coordination numbers in the Ge environment are determined both with the Mn flux value (evaporator temperature) and with the temperature at which quantum dots are grown, as well as with other synthesis conditions. The manganese concentration in the samples is determined.
- OSTI ID:
- 22917796
- Journal Information:
- Journal of Experimental and Theoretical Physics, Vol. 128, Issue 2; Other Information: Copyright (c) 2019 Pleiades Publishing, Inc.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7761
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION
ABSORPTION SPECTROSCOPY
ATOMIC FORCE MICROSCOPY
BINARY ALLOY SYSTEMS
DIFFUSION
ELECTRONIC STRUCTURE
FINE STRUCTURE
GERMANIUM
GERMANIUM COMPOUNDS
INTERSTITIALS
MANGANESE
MANGANESE COMPOUNDS
MICROSTRUCTURE
MOLECULAR BEAM EPITAXY
QUANTUM DOTS
RUTHERFORD BACKSCATTERING SPECTROSCOPY
SILICON
STOICHIOMETRY
SYNTHESIS
X-RAY SPECTROSCOPY