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Deep learning enhanced super-resolution x-ray fluorescence microscopy by a dual-branch network

Journal Article · · Optica
 [1];  [1];  [1];  [2];  [2];  [3];  [2]
  1. Stony Brook University, NY (United States)
  2. Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
  3. Stony Brook University, NY (United States); Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
X-ray fluorescence (XRF) microscopy is a powerful technique for quantifying the distribution of elements in complex materials, which makes it a crucial imaging technique across a wide range of disciplines in physical and biological sciences, including chemistry, materials science, microbiology, and geosciences. However, as a scanning microscopy technique, the spatial resolution of XRF imaging is inherently constrained by the x-ray probe profile and scanning step size. Here we propose a dual-branch machine learning (ML) model, which can extract scale-variant features and bypass abundant low-frequency information separately, to enhance the spatial resolution of the XRF images by mitigating the effects of blurring from the probe profile. The model is trained by simulated natural images, and a two-stage training strategy is used to overcome the domain gap between the natural images and experimental data. The tomography reconstruction from enhanced XRF projections shows an improvement in resolution by a scale factor of four and reveals distinct internal features invisible in low-resolution XRF within a battery sample. This study offers a promising approach for obtaining high-resolution XRF imaging from its low-resolution version, paving the way for future investigations in a broader range of disciplines and materials.
Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States); Stony Brook University, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF)
Grant/Contract Number:
SC0012673; SC0012704
OSTI ID:
2283313
Report Number(s):
BNL--225251-2024-JAAM
Journal Information:
Optica, Journal Name: Optica Journal Issue: 2 Vol. 11; ISSN 2334-2536
Publisher:
Optical Society of AmericaCopyright Statement
Country of Publication:
United States
Language:
English

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