Optical Characteristics of Zinc Oxide Films on Glass Substrates

Journal Article · Sat Sep 15 00:00:00 EDT 2018 · Journal of Applied Spectroscopy

DOI:https://doi.org/10.1007/S10812-018-0709-2· OSTI ID:22809892

Sotsky, A. B. ^[1]; Sotskaya, L. I. ^[2]; Filippov, V. V.; Shulicky, B. G.; Kashko, I. A. ^[3]

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1. A. A. Kuleshov Mogilev State University (Belarus)
2. Belarusian-Russian University (Belarus)
3. Belarusian State University of Informatics and Radioelectronics (Belarus)

An algorithm is developed for solving the inverse problem of multiangular spectrophotometry of a layer on a planeparallel substrate of fi nite thickness using s- and p-polarized waves. It allows the dispersive properties of the layer and substrate to be studied both far from and in the vicinity of the resonant wavelengths. The dispersive properties of layers of pure and Al-doped ZnO on glass substrates are investigated using it. It is shown that doping shifts the absorption band maximum to shorter wavelength and decreases the refractive index of the material. The applicability limits of known approximate expressions for determining the spectral dependence of the absorption coeffi cient of a layer from spectrophotometric data are estimated.

• OSTI ID: 22809892
• Journal Information: Journal of Applied Spectroscopy, Vol. 85, Issue 4; Other Information: Copyright (c) 2018 Springer Science+Business Media, LLC, part of Springer Nature; http://www.springer-ny.com; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-9037
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
ABSORPTION SPECTROSCOPY
ALGORITHMS
APPROXIMATIONS
DOPED MATERIALS
LAYERS
REFRACTIVE INDEX
THICKNESS
ZINC OXIDES