High-Resolution Thermal Profiling of a High-Power Diode Laser Facet During Aging

Wang, Luyang; Jha, Aman Kumar; Baxamusa, Salmaan H.; Kotovsky, Jack; Deri, Robert J.; Swertfeger, Rebecca B.; Thiagarajan, Prabhu; Crowley, Mark T.; Thaler, Gerald; Song, Jiyon; Pipe, Kevin P.

doi:10.1109/jqe.2023.3325256

Title: High-Resolution Thermal Profiling of a High-Power Diode Laser Facet During Aging

Journal Article · Thu Oct 19 00:00:00 EDT 2023 · IEEE Journal of Quantum Electronics

DOI:https://doi.org/10.1109/jqe.2023.3325256· OSTI ID:2280901

^[1];

^[2]; Kotovsky, Jack ^[2]; Deri, Robert J. ^[2]; Swertfeger, Rebecca B. ^[2]; Thiagarajan, Prabhu ^[3]; Crowley, Mark T. ^[3]; Thaler, Gerald ^[3]; Song, Jiyon ^[3]; Pipe, Kevin P. ^[1]

Univ. of Michigan, Ann Arbor, MI (United States)
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Leonardo Electronics Inc., Tucson, AZ (United States)

Here, we study the facet temperature distribution of a high-power diode laser over its lifetime using a noncontact, high spatial resolution CCD-based thermoreflectance technique. Based on the known correlation between non-radiative defects and heating, thermal maps can provide valuable information regarding the formation and evolution of small point defects that are at or near the facet during aging. In the laser under study in this work we measure the appearance of local hot spots on the facet, including concentrated hot spots that appear just before or just after COD and are correlated with loss of local light emission. The locations of these hot spots do not exhibit morphology changes in high-resolution SEM imaging of the facet, indicating that the related defects are too small to be observable in SEM or are located at some depth under the facet. Prior to COD, we measure a gradual facet temperature increase accompanied by a gradual optical power decrease and gradual facet optical absorption increase, indicating gradual degradation of the laser.

This content will become publicly available on Sat Oct 19 00:00:00 EDT 2024

Cite

Export

Save

Research Organization:: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA); USDOE Laboratory Directed Research and Development (LDRD) Program

Grant/Contract Number:: AC52-07NA27344

OSTI ID:: 2280901

Report Number(s):: LLNL-JRNL-839880; 1060418

Journal Information:: IEEE Journal of Quantum Electronics, Vol. 60, Issue 1; ISSN 0018-9197

Publisher:: IEEECopyright Statement

Country of Publication:: United States

Language:: English

References (26)

Influence of device fabrication parameters on gradual degradation of (AlGa)As cw laser diodes Ladany, I.; Kressel, H. Applied Physics Letters, Vol. 25, Issue 12 https://doi.org/10.1063/1.1655370	journal	December 1974
CCD-based thermoreflectance microscopy: principles and applications Farzaneh, M.; Maize, K.; Lüerßen, D. Journal of Physics D: Applied Physics, Vol. 42, Issue 14 https://doi.org/10.1088/0022-3727/42/14/143001	journal	June 2009
Catastrophic damage of Al _x Ga _{1− x} As double‐heterostructure laser material Henry, C. H.; Petroff, P. M.; Logan, R. A. Journal of Applied Physics, Vol. 50, Issue 5 https://doi.org/10.1063/1.326278	journal	May 1979
Defect signatures in degraded high power laser diodes Hortelano, V.; Anaya, J.; Souto, J. Microelectronics Reliability, Vol. 53, Issue 9-11 https://doi.org/10.1016/j.microrel.2013.07.071	journal	September 2013
Thermoreflectance based thermal microscope Christofferson, James; Shakouri, Ali Review of Scientific Instruments, Vol. 76, Issue 2 https://doi.org/10.1063/1.1850632	journal	February 2005
High-efficiency high-power 808-nm laser array and stacked arrays optimized for elevated temperature operation Crump, Paul A.; Crum, Trevor R.; DeVito, Mark A. SPIE Proceedings https://doi.org/10.1117/12.533262	conference	June 2004
Laser diode reliability: crystal defects and degradation modes Jiménez, Juan Comptes Rendus Physique, Vol. 4, Issue 6 https://doi.org/10.1016/S1631-0705(03)00097-5	journal	July 2003
Application of Diode Laser in the Treatment of Dentine Hypersensitivity GojkovVukelic, Mirjana; Hadzic, Sanja; Zukanovic, Amila Medical Archives, Vol. 70, Issue 6 https://doi.org/10.5455/medarh.2016.70.466-469	journal	January 2016
Temperature mapping and thermal lensing in large-mode, high-power laser diodes Chan, P. K. L.; Pipe, K. P.; Plant, J. J. Applied Physics Letters, Vol. 89, Issue 20 https://doi.org/10.1063/1.2388884	journal	November 2006
Defect evolution during catastrophic optical damage of diode lasers Hempel, Martin; La Mattina, Fabio; Tomm, Jens W. Semiconductor Science and Technology, Vol. 26, Issue 7 https://doi.org/10.1088/0268-1242/26/7/075020	journal	April 2011
Clinical Application of Diode Laser (980 nm) in Maxillofacial Surgical Procedures Aldelaimi, Tahrir N.; Khalil, Afrah A. Journal of Craniofacial Surgery, Vol. 26, Issue 4 https://doi.org/10.1097/SCS.0000000000001727	journal	June 2015
Measurement of facet optical absorption in high power diode lasers using thermoreflectance Jha, Aman Kumar; Li, Chen; Pipe, Kevin P. 2019 IEEE High Power Diode Lasers and Systems Conference (HPD) https://doi.org/10.1109/HPD48113.2019.8938681	conference	October 2019
Observation of deep level defects within the waveguide of red-emitting high-power diode lasers Ropers, Claus; Tien, Tran Quoc; Lienau, Christoph Applied Physics Letters, Vol. 88, Issue 13 https://doi.org/10.1063/1.2190815	journal	March 2006
Thermal processes in high-power laser bars investigated by spatially resolved thermoreflectance Pierścińska, Dorota; Kozlowska, Anna; Pierściński, Kamil Journal of Materials Science: Materials in Electronics, Vol. 19, Issue S1 https://doi.org/10.1007/s10854-008-9643-z	journal	March 2008
Reliability of 980 nm pump lasers for submarine, long-haul terrestrial, and low cost metro applications Pfeiffer, H. -U.; Arlt, S.; Jacob, M. Optical Fiber Communication Conference and Exhibit https://doi.org/10.1109/OFC.2002.1036502	conference	March 2002
Gradual degradation of red-emitting high-power diode laser bars Ziegler, Mathias; Tien, Tran Quoc; Schwirzke-Schaaf, Sandy Applied Physics Letters, Vol. 90, Issue 17 https://doi.org/10.1063/1.2732202	journal	April 2007
Thermal properties and degradation behavior of red-emitting high-power diode lasers Tien, Tran Quoc; Weik, Fritz; Tomm, Jens W. Applied Physics Letters, Vol. 89, Issue 18 https://doi.org/10.1063/1.2374693	journal	October 2006
Micro-Temperature Measurements on Semiconductor Laser Mirrors by Reflectance Modulation: A Newly Developed Technique for Laser Characterization Epperlein, Peter-Wolfgang Japanese Journal of Applied Physics, Vol. 32, Issue Part 1, No. 12A https://doi.org/10.1143/JJAP.32.5514	journal	December 1993
Highly reliable high-efficiency wavelength-stabilized 885 nm diode laser bars Leisher, Paul; Bao, Ling; Huang, Hua Laser Technology for Defense and Security V https://doi.org/10.1117/12.820872	conference	May 2009
Thermoreflectance imaging of current dynamics in high power SiGe heterojunction bipolar transistors Chan, Paddy K. L.; Pipe, Kevin P.; Qin, Guoxuan Applied Physics Letters, Vol. 89, Issue 23 https://doi.org/10.1063/1.2402947	journal	December 2006
Nanoscale Characterization of V-defect in InGaN/GaN QWs LEDs using Near-Field Scanning Optical Microscopy Li, Yufeng; Tang, Weihan; Zhang, Ye Nanomaterials, Vol. 9, Issue 4, p. 633 https://doi.org/10.3390/nano9040633	journal	April 2019
Band parameters for III–V compound semiconductors and their alloys Vurgaftman, I.; Meyer, J. R.; Ram-Mohan, L. R. Journal of Applied Physics, Vol. 89, Issue 11, p. 5815-5875 https://doi.org/10.1063/1.1368156	journal	June 2001
Optical strength of semiconductor laser materials Eliseev, P. G. Progress in Quantum Electronics, Vol. 20, Issue 1 https://doi.org/10.1016/0079-6727(95)00002-X	journal	January 1996
Investigation of dark line defects induced by catastrophic optical damage in broad-area AlGaInP laser diodes Bou Sanayeh, M.; Jaeger, A.; Schmid, W. Applied Physics Letters, Vol. 89, Issue 10 https://doi.org/10.1063/1.2345225	journal	September 2006
Thermal relaxation time and heat distribution in pulsed InGaAs quantum dot lasers Chan, P. K. L.; Pipe, K. P.; Mi, Z. Applied Physics Letters, Vol. 89, Issue 1 https://doi.org/10.1063/1.2219721	journal	July 2006
Degradation of (AlGa)As DH lasers due to facet oxidation Yuasa, T.; Ogawa, M.; Endo, K. Applied Physics Letters, Vol. 32, Issue 2 https://doi.org/10.1063/1.89942	journal	January 1978

Similar Records

Thermal imaging of high power diode lasers subject to back-irradiance

Journal Article · Wed Mar 07 00:00:00 EST 2018 · Applied Physics Letters · OSTI ID:2280901

Li, C.; Pipe, K. P.; Cao, C.; +3 more

Catastrophic optical degradation of the output facet of high-power single-transverse-mode diode lasers. 2. Calculation of the spatial temperature distribution and threshold of the catastrophic optical degradation

Journal Article · Fri Sep 10 00:00:00 EDT 2010 · Quantum Electronics (Woodbury, N.Y.) · OSTI ID:2280901

Miftakhutdinov, D R; Bogatov, Alexandr P; Drakin, A E

Catastrophic optical degradation of the output facet of high-power single-transverse-mode diode lasers. 1. Physical model

Journal Article · Fri Sep 10 00:00:00 EDT 2010 · Quantum Electronics (Woodbury, N.Y.) · OSTI ID:2280901

Miftakhutdinov, D R; Bogatov, Alexandr P; Drakin, A E

Related Subjects

47 OTHER INSTRUMENTATION
lasers
catastrophic optical damage
laser diodes
gradual degradation
thermal failure
thermoreflectance

Title: High-Resolution Thermal Profiling of a High-Power Diode Laser Facet During Aging

Citation Formats

References (26)

Similar Records

Related Subjects