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Synergistic effect of surface defect and interface heterostructure on TiO2/BiOIO3 photocatalytic oxide gas-phase mercury

Journal Article · · Materials Research Bulletin
;  [1];  [2]; ;  [1]
  1. College of Energy and Mechanical Engineering, Shanghai University of Electric Power, Shanghai 200090 (China)
  2. College of Environmental Science and Engineering, Donghua University, Shanghai 201620 (China)

Highlights: • TiO{sub 2}/BiOIO{sub 3} photocatalysts were prepared for the first time. • Synergistic effect of surface defect and interface heterostructure on TiO{sub 2}/BiOIO{sub 3} was investigated in detail. • The SO{sub 2} and NO obtain an adverse effect on photocatalytic oxide mercury while the HCl can promote the oxidation process. • The mechanism of photocatalytic removal gas-phase mercury by TiO{sub 2}/BiOIO{sub 3} photocatalysts was proposed. - Abstract: Enhancing the photocatalytic activity of the semiconductors by introducing surface defect or forming interface heterostructure has attracted widespread interests. In this work, a novel photocatalysts, defect TiO{sub 2}/BiOIO{sub 3} heterostructure possessing both surface defect and interface heterostructure, was prepared via calcination method for the first time. The physicochemical property of the as-prepared defect TiO{sub 2}/BiOIO{sub 3} heterostructure was investigated by XRD, SEM, TEM, EDS, XPS, FT-IR, BET, DRS, and PL characterization. The results indicated that introducing surface defect and forming interface heterostructure on photocatalysts at the same time can enhance the visible light response, promote the transfer velocity of the photocarriers and suppress the recombination of photo-generated electron-hole pairs. Furthermore, it exhibits an enhanced activity on photocatalytic oxidation of gas-phase elemental mercury (Hg°), which shows the highest Hg° oxidation efficiency of 91.12% under visible light.

OSTI ID:
22805142
Journal Information:
Materials Research Bulletin, Journal Name: Materials Research Bulletin Vol. 103; ISSN MRBUAC; ISSN 0025-5408
Country of Publication:
United States
Language:
English