Direct observations of crystal defects in polycrystalline diamond

Journal Article · Wed Aug 15 04:00:00 EDT 2018 · Materials Characterization

DOI:https://doi.org/10.1016/J.MATCHAR.2018.05.036· OSTI ID:22805078

Kaboli, Shirin

Highlights: • Electron channeling contrast imaging of crystal defects in polycrystalline diamond • Introducing acid etching as a novel protocol for diamond surface preparation • Characterization of {111} twins, {111} stacking faults and {111} helical dislocations in diamond using ECCI and EBSD - Abstract: Crystal defects are abundant in synthetic diamond produced by chemical vapor deposition (CVD). We present the first images of crystal defects in a bulk polycrystalline CVD diamond sample using general electron channeling contrast imaging (ECCI) in a field emission scanning electron microscope (FE-SEM). For enhancement of channeling contrast of this material, we introduce a novel protocol for diamond surface preparation that involves acid etching. Using this protocol, we imaged three types of crystal defects including twins, stacking faults and dislocations. Each defect was identified based on its appearance in electron channeling contrast (ECC) micrographs. We analyzed grains containing twins and dislocations using electron backscatter diffraction (EBSD) crystal orientation mapping. We found a large population of grains that contained Σ3 type twins on {111} planes with a 60°<111> angle–axis pair of misorientation for twin boundaries. In addition, we identified {111} stacking faults and {111} helical dislocations. These observations are in agreement with reports of crystal defects in CVD diamond thin foils studied by a transmission electron microscope (TEM).

• OSTI ID: 22805078
• Journal Information: Materials Characterization, Journal Name: Materials Characterization Vol. 142; ISSN 1044-5803; ISSN MACHEX
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BACKSCATTERING
CHEMICAL VAPOR DEPOSITION
DISLOCATIONS
ELECTRON CHANNELING
ELECTRON DIFFRACTION
ETCHING
FIELD EMISSION
POLYCRYSTALS
SCANNING ELECTRON MICROSCOPY
STACKING FAULTS
SURFACES
TRANSMISSION ELECTRON MICROSCOPY