Microstructure detection of Mg-Zi-Ti-Si amorphous composite coating prepared by SMAT

Journal Article · Sun Jan 14 23:00:00 EST 2018 · Materials Characterization

DOI:https://doi.org/10.1016/J.MATCHAR.2017.11.051· OSTI ID:22804870

Chen, Ke; Yang, Hemei ^[1]; Gao, Junshan ^[2]; Yang, Yong ^[1]

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1. College of Engineering, Nanjing Agricultural University, Nanjing 210031 (China)
2. College of Materials Science and Engineering, Anhui University of Science and Technology, Huainan, Anhui 232001 (China)

Highlights: • The Mg-Zn-Ti-Si amorphous composite coating was prepared on Mg alloy via SMAT. • Except for amorphous portion, the phases of coating include Zn, Mg{sub 7}Zn{sub 3}, and Si. • The coating was thick and rough but it was well combined with the matrix. • During SMAT, the matrix surface was also strengthened because of solid-solution and grain refinement. - Abstract: The Mg-Zn-Ti-Si coating was prepared on Mg alloy through surface mechanical attrition treatment (SMAT) which was simple and low-cost. The microstructure and phase composition of coating were detected through a scanning electron microscope (SEM), an X-ray diffractometer (XRD) and a high resolution transmission electron microscope (HRTEM). The results demonstrated that the layer thickness, which depended on the rotation speed, was 20–80 μm. Although the coating was rough, it was well combined with the matrix. The XRD pattern and HRTEM image analysis demonstrated that the coating contained both amorphous and crystalline phases (Zn, Mg{sub 7}Zn{sub 3} and Si). The process also led to matrix surface strengthening; the mechanisms are solid solution and grain refinement.

• OSTI ID: 22804870
• Journal Information: Materials Characterization, Journal Name: Materials Characterization Vol. 135; ISSN 1044-5803; ISSN MACHEX
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
AMORPHOUS STATE
COATINGS
DETECTION
GRAIN REFINEMENT
IMAGE PROCESSING
LAYERS
MAGNESIUM COMPOUNDS
MICROSTRUCTURE
QUATERNARY ALLOY SYSTEMS
SCANNING ELECTRON MICROSCOPY
SILICON COMPOUNDS
SOLID SOLUTIONS
SURFACES
THICKNESS
TITANIUM COMPOUNDS
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION
X-RAY DIFFRACTOMETERS
ZINC COMPOUNDS