Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters

Pinder, Joshua W.; Major, George H.; Baer, Donald R.; Terry, Jeff; Whitten, James E.; Čechal, Jan; Crossman, Jacob D.; Lizarbe, Alvaro J.; Jafari, Samira; Easton, Christopher D.; Baltrusaitis, Jonas; van Spronsen, Matthijs A.; Linford, Matthew R.

doi:10.1016/j.apsadv.2023.100534

Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters

Journal Article · Thu Feb 01 00:00:00 UTC 2024 · Applied Surface Science Advances

DOI:https://doi.org/10.1016/j.apsadv.2023.100534· OSTI ID:2279097

Pinder, Joshua W.; Major, George H.; Baer, Donald R.; Terry, Jeff; Whitten, James E.; Čechal, Jan; Crossman, Jacob D.; Lizarbe, Alvaro J.; Jafari, Samira; Easton, Christopher D.; Baltrusaitis, Jonas; van Spronsen, Matthijs A.;

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Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC0012577

OSTI ID:: 2279097

Journal Information:: Applied Surface Science Advances, Journal Name: Applied Surface Science Advances Journal Issue: C Vol. 19; ISSN 2666-5239

Publisher:: ElsevierCopyright Statement

Country of Publication:: Netherlands

Language:: English

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Cluster cleaned HOPG by XPS Morgan, David J. Surface Science Spectra, Vol. 24, Issue 2 https://doi.org/10.1116/1.4993771	journal	October 2017
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Raw-to-repository characterization data conversion for repeatable, replicable, and reproducible measurements Suzuki, Mineharu; Nagao, Hiroko; Harada, Yoshitomo Journal of Vacuum Science & Technology A, Vol. 38, Issue 2 https://doi.org/10.1116/1.5128408	journal	March 2020
Method for correcting peak overlaps in quantitative Auger electron spectroscopy of Cr-containing oxides Burrell, Michael C. Journal of Vacuum Science & Technology A, Vol. 38, Issue 1 https://doi.org/10.1116/1.5128901	journal	January 2020
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Guide to making XPS measurements on nanoparticles Baer, Donald R. Journal of Vacuum Science & Technology A, Vol. 38, Issue 3 https://doi.org/10.1116/1.5141419	journal	May 2020
Uncertainties in photoemission peak fitting accounting for the covariance with background parameters Herrera-Gomez, Alberto Journal of Vacuum Science & Technology A, Vol. 38, Issue 3 https://doi.org/10.1116/1.5143132	journal	May 2020
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Silicon (100)/SiO2 by XPS Jensen, David S.; Kanyal, Supriya S.; Madaan, Nitesh Surface Science Spectra, Vol. 20, Issue 1 https://doi.org/10.1116/11.20121101	journal	September 2013
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Procedure which allows the performance and calibration of an XPS instrument to be checked rapidly and frequently Wolstenholme, John Journal of Vacuum Science & Technology A, Vol. 38, Issue 4 https://doi.org/10.1116/6.0000224	journal	July 2020
Experimental determination of electron attenuation lengths in complex materials by means of epitaxial film growth: Advantages and challenges Chambers, Scott A.; Du, Yingge Journal of Vacuum Science & Technology A, Vol. 38, Issue 4 https://doi.org/10.1116/6.0000291	journal	July 2020
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Introduction to lateral resolution and analysis area measurements in XPS Unger, Wolfgang E. S.; Stockmann, Jörg M.; Senoner, Mathias Journal of Vacuum Science & Technology A, Vol. 38, Issue 5 https://doi.org/10.1116/6.0000398	journal	September 2020
Introduction to x-ray photoelectron spectroscopy Stevie, Fred A.; Donley, Carrie L. Journal of Vacuum Science & Technology A, Vol. 38, Issue 6 https://doi.org/10.1116/6.0000412	journal	December 2020
Sample handling, preparation and mounting for XPS and other surface analytical techniques Stevie, Fred A.; Garcia, Roberto; Shallenberger, Jeffrey Journal of Vacuum Science & Technology A, Vol. 38, Issue 6 https://doi.org/10.1116/6.0000421	journal	December 2020
Introductory guide to the application of XPS to epitaxial films and heterostructures Chambers, Scott A.; Wang, Le; Baer, Donald R. Journal of Vacuum Science & Technology A, Vol. 38, Issue 6 https://doi.org/10.1116/6.0000465	journal	December 2020
Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene Reed, Benjamen P.; Cant, David J. H.; Spencer, Steve J. Journal of Vacuum Science & Technology A, Vol. 38, Issue 6 https://doi.org/10.1116/6.0000577	journal	December 2020
Al Kα XPS reference spectra of polyethylene for all instrument geometries Shard, Alexander G.; Reed, Benjamen P. Journal of Vacuum Science & Technology A, Vol. 38, Issue 6 https://doi.org/10.1116/6.0000578	journal	December 2020
Practical guide to the use of backgrounds in quantitative XPS Tougaard, Sven Journal of Vacuum Science & Technology A, Vol. 39, Issue 1 https://doi.org/10.1116/6.0000661	journal	January 2021
Accuracy limitations for composition analysis by XPS using relative peak intensities: LiF as an example Brundle, Christopher Richard; Crist, Bruce Vincent; Bagus, Paul S. Journal of Vacuum Science & Technology A, Vol. 39, Issue 1 https://doi.org/10.1116/6.0000674	journal	January 2021
Practical guides for x-ray photoelectron spectroscopy (XPS): Interpreting the carbon 1s spectrum Gengenbach, Thomas R.; Major, George H.; Linford, Matthew R. Journal of Vacuum Science & Technology A, Vol. 39, Issue 1 https://doi.org/10.1116/6.0000682	journal	January 2021
Assessment of the frequency and nature of erroneous x-ray photoelectron spectroscopy analyses in the scientific literature Major, George H.; Avval, Tahereh G.; Moeini, Behnam Journal of Vacuum Science & Technology A, Vol. 38, Issue 6 https://doi.org/10.1116/6.0000685	journal	December 2020
Erratum: “Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements” [J. Vac. Sci. Technol. A 37, 031401 (2019)] Baer, Donald R.; Artyushkova, Kateryna; Richard Brundle, Christopher Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 39, Issue 1 https://doi.org/10.1116/6.0000822	journal	December 2020
Introduction to topical collection: Reproducibility challenges and solutions with a focus on guides to XPS analysis Baer, Donald R.; McGuire, Gary E.; Artyushkova, Kateryna Journal of Vacuum Science & Technology A, Vol. 39, Issue 2 https://doi.org/10.1116/6.0000873	journal	March 2021
Guide to XPS data analysis: Applying appropriate constraints to synthetic peaks in XPS peak fitting Major, George H.; Fernandez, Vincent; Fairley, Neal Journal of Vacuum Science & Technology A, Vol. 40, Issue 6 https://doi.org/10.1116/6.0001975	journal	December 2022
Erratum: “Practical guide for curve fitting in x-ray photoelectron spectroscopy” [J. Vac. Sci. Technol. A 38, 061203 (2020)] Major, George H.; Fairley, Neal; Sherwood, Peter M. A. Journal of Vacuum Science & Technology A, Vol. 40, Issue 5 https://doi.org/10.1116/6.0002004	journal	July 2022
Perspective on improving the quality of surface and material data analysis in the scientific literature with a focus on x-ray photoelectron spectroscopy (XPS) Major, George H.; Pinder, Joshua W.; Austin, Daniel E. Journal of Vacuum Science & Technology A, Vol. 41, Issue 3 https://doi.org/10.1116/6.0002437	journal	May 2023
Double Lorentzian lineshape for asymmetric peaks in photoelectron spectroscopy Herrera-Gomez, Alberto; Guzman-Bucio, Dulce Maria; Carmona-Carmona, Abraham Jorge Journal of Vacuum Science & Technology A, Vol. 41, Issue 4 https://doi.org/10.1116/6.0002602	journal	June 2023
Insufficient reporting of x-ray photoelectron spectroscopy instrumental and peak fitting parameters (metadata) in the scientific literature Major, George H.; Clark, B. Maxwell; Cayabyab, Kevin Journal of Vacuum Science & Technology A, Vol. 41, Issue 4 https://doi.org/10.1116/6.0002714	journal	May 2023
Reproducible Research in Computational Science Peng, R. D. Science, Vol. 334, Issue 6060 https://doi.org/10.1126/science.1213847	journal	December 2011
Introduction to Chemical State Analysis by XPS with Examples Major, George H.; Fairley, Neal; Fernandez, Vincent Applications of X-ray Photoelectron Spectroscopy to Catalytic Studies (Catalytic Science Series), p. 51-70 https://doi.org/10.1142/9781800613294_0003	book	July 2023
Applications of X-ray Photoelectron Spectroscopy to Catalytic Studies: From Routine Analysis to Cutting-Edge Surface Characterization Zafeiratos, Spyridon Catalytic Science Series https://doi.org/10.1142/q0392	book	July 2023
The Scope and Limitations of Curve Fitting Maddams, W. F. Applied Spectroscopy, Vol. 34, Issue 3 https://doi.org/10.1366/0003702804730312	journal	May 1980
Characterization and Toxicity Analysis of Lab-Created Respirable Coal Mine Dust from the Appalachians and Rocky Mountains Regions Salinas, Vanessa; Das, Milton; Jacquez, Quiteria Minerals, Vol. 12, Issue 7 https://doi.org/10.3390/min12070898	journal	July 2022
Characterization of Nanoparticle Batch-To-Batch Variability Mülhopt, Sonja; Diabaté, Silvia; Dilger, Marco Nanomaterials, Vol. 8, Issue 5 https://doi.org/10.3390/nano8050311	journal	May 2018

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