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Fourier-based methods for removing mesh anomalies from angle resolved photoemission spectra

Journal Article · · Journal of Electron Spectroscopy and Related Phenomena
 [1];  [1];  [1];  [2];  [2];  [3];  [4];  [5];  [1]
  1. New York University (NYU), NY (United States)
  2. University of Washington, Seattle, WA (United States)
  3. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  4. Thapar Institute of Engineering and Technology, Patiala (India); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  5. Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
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Recent improvements to spatial resolution in angle-resolved photo-emission spectroscopy (ARPES) have made it common to perform measurements with a very brief dwell time, for the purpose of mapping the spectral function over large surface regions. However, rapid measurement modalities can suffer a grid-like intensity modulation due to a wire mesh that is typically placed in front of the ARPES detector to block stray electrons. Here, we explore Fourier-based methods that can effectively remove this artifact, and improve the quality of ARPES images obtained in rapid scanning modes. In conclusion, an open source software package is provided containing implementations of demonstrated algorithms.
Research Organization:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
Federal Ministry of Education and Research (BMBF); Gordon and Betty Moore Foundation; Kiel University; National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF)
Grant/Contract Number:
AC02-05CH11231; SC0019443
OSTI ID:
2278659
Alternate ID(s):
OSTI ID: 1890551
Journal Information:
Journal of Electron Spectroscopy and Related Phenomena, Journal Name: Journal of Electron Spectroscopy and Related Phenomena Vol. 260; ISSN 0368-2048
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English

References (8)

Unsupervised moiré pattern removal for recaptured screen images journal October 2021
Spectromicroscopic measurement of surface and bulk band structure interplay in a disordered topological insulator journal January 2020
First NanoARPES User Facility Available at SOLEIL: An Innovative and Powerful Tool for Studying Advanced Materials journal March 2014
Nano focusing of soft X-rays by a new capillary mirror optic journal July 2018
Angle-resolved photoemission studies of the cuprate superconductors journal April 2003
Angle-resolved photoemission spectroscopy and imaging with a submicrometre probe at the SPECTROMICROSCOPY-3.2L beamline of Elettra journal May 2010
microARPES and nanoARPES at diffraction-limited light sources: opportunities and performance gains journal August 2014
Moiré Reduction Using Inflection Point and Color Variation in Digital Camera of No Optical Low Pass Filter journal January 2015

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Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ARPES
Data analysis
Mesh correction
Spectromicroscopy