Development of Broadband Microwave Absorber and Measurement of Its Magnetic and Microwave Properties

Journal Article · Mon Jan 15 00:00:00 EST 2018 · Journal of Superconductivity and Novel Magnetism

DOI:https://doi.org/10.1007/S10948-017-4216-0· OSTI ID:22774138

Araz, İsa ^[1]; Genç, Fazilet ^[2]

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1. TUBITAK National Metrology Institute, Atomic Sensor Laboratory (Turkey)
2. Gebze Institute of Technology, Department of Physics (Turkey)

Toroid shape Co-doped barium hexaferrites of composition (BaFe{sub 11}CoO{sub 19}) are prepared by standard sintering technology as a sample. In this work, XRD is used to identify the structure of synthesized sample. Vibrating sample magnetometer is used to obtain magnetic hysteresis loop of sample. Scanning electron microscope is used for surface morphology of sample. The complex permeability and permittivity are measured with commercial automation measurement set up in the 2–18 GHz frequency range. As a result of measurement, the calculation of reflection loss of the synthesized samples has been carried out. Investigation of microwave absorption properties revealed that the maximum reflection loss of Co-doped barium hexaferrite sample is around −20 dB and almost flat in the measurement frequency band. From these results, it was concluded that Co-doped barium hexaferrites of composition had a good potential as microwave absorber in the broadband frequency range.

• OSTI ID: 22774138
• Journal Information: Journal of Superconductivity and Novel Magnetism, Vol. 31, Issue 1; Other Information: Copyright (c) 2018 Springer Science+Business Media, LLC, part of Springer Nature; Article Copyright (c) 2017 Springer Science+Business Media, LLC; http://www.springer-ny.com; Country of input: International Atomic Energy Agency (IAEA); ISSN 1557-1939
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION
BARIUM COMPOUNDS
DOPED MATERIALS
FERRITES
GHZ RANGE
HYSTERESIS
MAGNETIC PROPERTIES
MICROWAVE RADIATION
MORPHOLOGY
PERMEABILITY
PERMITTIVITY
REFLECTION
SCANNING ELECTRON MICROSCOPY
SINTERING
SURFACES
VIBRATING SAMPLE MAGNETOMETERS
X-RAY DIFFRACTION