Carbon-13 labeling for improved tracer depth profiling of organic materials using secondary ion mass spectrometry

Journal Article · Tue Aug 15 04:00:00 EDT 2006 · Journal of the American Society for Mass Spectrometry

DOI:https://doi.org/10.1016/J.JASMS.2006.03.018· OSTI ID:22774026

Harton, S. E. ^[1]; Stevie, F. A. ^[2]

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1. North Carolina State University, Department of Materials Science and Engineering (United States)
2. North Carolina State University, Analytical Instrumentation Facility (United States)

{sup 13}C labeling is introduced as an alternative to deuterium labeling for analysis of organic materials using secondary ion mass spectrometry (SIMS). A model macromolecular system composed of polystyrene (PS) and poly(methyl methacrylate) (PMMA) was used to compare the effects of isotopic labeling using both deuterium substitution (dPS) and {sup 13}C labeling ({sup 13}C-PS). Clear evidence is shown that deuterium labeling does introduce changes in the thermodynamic properties of the system, with the observation of segregation of dPS to an hPS:dPS/hPMMA interface. This type of behavior could significantly impact many types of investigations due to the potential for improper interpretation of experimental results as a consequence of labeling-induced artifacts. {sup 13}C labeling is shown to provide a true tracer for analysis using SIMS.

• OSTI ID: 22774026
• Journal Information: Journal of the American Society for Mass Spectrometry, Journal Name: Journal of the American Society for Mass Spectrometry Journal Issue: 8 Vol. 17; ISSN 1044-0305; ISSN JAMSEF
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CARBON 13
COMPARATIVE EVALUATIONS
DEUTERIUM
ION MICROPROBE ANALYSIS
MASS SPECTROSCOPY
PMMA
POLYSTYRENE
THERMODYNAMIC PROPERTIES