XRD and EBSD analysis of anisotropic microstructure development in cold rolled F138 stainless steel
- Instituto de Física Rosario, FCEIA-UNR-CONICET, Bv. 27 de Febrero 210 bis, S2000EZP Rosario (Argentina)
- Departamento de Engenharia de Materiais, Universidade Federal de São Carlos, Rodovia Washington Luís, km 235 - SP-310, São Carlos, SP 13565-905 (Brazil)
- Institut für Werkstoffkunde und Werkstofftechnik, TU Clausthal, Agricolastr. 6, 38678 Clausthal-Zellerfeld. Helmholtz-Zentrum Geesthacht, GEMS Outstation, Notkestr. 85, 22607 Hamburg (Germany)
The microstructural characteristics of deformation-processed materials highly influence their mechanical properties. For a complete characterization of a microstructure both local and global information must be gathered, which requires the combination of different analysis techniques. X-ray and Electron Backscatter Diffraction were used in the present paper to characterize the deformation induced in a cold rolled F138 austenitic stainless steel sample. The results obtained using laboratory and synchrotron X-ray sources were compared and combined with EBSD quantitative results, allowing the global and local characterization and orientation dependence of the deformation microstructure. A particular behavior was observed in the XRD data corresponding to the planes with < 220 >∥ ND, likely due to a smaller amount of defects accumulated in the crystals with that particular orientation. EBSD was used to separate the scans data into partitions and to calculate misorientation variables and parameters, showing that this behavior can be attributed to a combination of larger grain sizes, lower local boundary misorientations and dislocation densities for crystals having < 220 >∥ ND. Several conclusions, of general validity for the evaluation of microstructure anisotropy, can be extracted from the results. - Highlights: •Combined XRD and EBSD for studying microstructure gave a superb insight on anisotropic accumulation of defects. •W-H and CMWP methods were applied for checking consistency of results. •XRD showed that a smaller accumulation of defects occurred in crystals with < 220 >∥ ND. •High brilliance X-ray beam allowed to study the anisotropy of defect accumulation.
- OSTI ID:
- 22689686
- Journal Information:
- Materials Characterization, Vol. 123; Other Information: Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
- Country of Publication:
- United States
- Language:
- English
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