Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Surface modification of small particle TiO{sub 2} collloids with cysteine for enhanced photochemical reduction: An EPR study

Journal Article · · Journal of Physical Chemistry
DOI:https://doi.org/10.1021/jp952002p· OSTI ID:226768

Surface complexation of colloidal titanium dioxide nanoparticles (40-60 A) with cysteine was investigated by electron paramagnetic resonance (EPR) and infrared (diffuse reflectance infrared Fourier transform - DRIFT) spectroscopies. Cysteine was found to bind strongly to the TiO{sub 2} surface, resulting in formation of new trapping sites where photogenerated electrons and holes are localized. Illumination of cysteine-modified TiO{sub 2} at 77 K resulted in formation of cysteine radicals with the unpaired electron localized on the carboxyl group. Upon warming to 150 K, these radicals are transformed into sulfur-centered radicals as observed by EPR spectroscopy. We have demonstrated the existence of two surface Ti(III) centers on cysteine-modified TiO{sub 2} particles having different extents of tetragonal distortion of the octahedral crystal field. Upon addition of lead ions, a new complex of cysteine that bridges surface titanium atoms and lead ions was detected by IR spectroscopy. Illumination of lead/cysteine-modified TiO{sub 2} did not result in the formation of sulfur-centered radicals. Instead, a symmetrical, lattice defect type EPR signal for trapped holes was observed. Addition of methanol to this system resulted in the formation of a .CH{sub 2}OH radical at 8.2 K. After the temperature was raised to 120 K, doubling of the signal associated with electrons trapped at the particle surface (Ti(III){sub surf}) was observed. 46 refs., 6 figs.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
226768
Journal Information:
Journal of Physical Chemistry, Journal Name: Journal of Physical Chemistry Journal Issue: 11 Vol. 100; ISSN JPCHAX; ISSN 0022-3654
Country of Publication:
United States
Language:
English