Structural studies of ZnS:Cu (5 at %) nanocomposites in porous Al{sub 2}O{sub 3} of different thicknesses

Journal Article · Wed Feb 15 04:00:00 EST 2017 · Semiconductors

DOI:https://doi.org/10.1134/S1063782617020221· OSTI ID:22649647

Trigub, A. L.; Chukavin, A. I.; Beltiukov, A. N. ^[1]

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1. Physical-Technical Institute, Russian Academy of Sciences (Ural Branch) (Russian Federation)

We present EXAFS, XANES, and X-ray diffraction data on nanoscale ZnS:Cu (5 at %) structures fabricated by the thermal deposition of a ZnS and Cu powder mixture in porous anodic alumina matrices with a pore diameter of 80 nm and thicknesses of 1, 3, and 5 μm. The results obtained are compared with data on ZnS:Cu films deposited onto a polycor surface. According to X-ray diffraction data, the samples contain copper and zinc compounds with sulfur (Cu{sub 2}S and ZnS, respectively); the ZnS compound is in the cubic (sphalerite) and hexagonal (wurtzite) modifications. EXAFS and XANES studies at the K absorption edges of zinc and copper showed that, in samples deposited onto polycor and alumina with thicknesses of 3 and 5 μm, most copper atoms form the Cu{sub 2}S compound, while, in the sample deposited onto a 1-μm-thick alumina layer, copper atoms form metallic particles on the sample surface. Copper crystals affect the Zn–S interatomic distance in the sample with a 1-μm-thick porous Al{sub 2}O{sub 3} layer; this distance is smaller than in the other samples.

• OSTI ID: 22649647
• Journal Information: Semiconductors, Journal Name: Semiconductors Journal Issue: 2 Vol. 51; ISSN SMICES; ISSN 1063-7826
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
77 NANOSCIENCE AND NANOTECHNOLOGY
ABSORPTION SPECTROSCOPY
ALUMINIUM OXIDES
COPPER
COPPER SULFIDES
CRYSTALS
FINE STRUCTURE
INTERATOMIC DISTANCES
K ABSORPTION
LAYERS
MATRIX MATERIALS
NANOCOMPOSITES
NANOSTRUCTURES
POROUS MATERIALS
SULFIDE MINERALS
THIN FILMS
X-RAY DIFFRACTION
X-RAY SPECTROSCOPY
ZINC SULFIDES