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Title: Peculiarities of section topograms for the multiple diffraction of X rays

Abstract

The distortion of interference fringes on the section topograms of single crystal due to the multiple diffraction of X rays has been investigated. The cases of the 220 and 400 reflections in a silicon crystal in the form of a plate with a surface oriented normally to the [001] direction are considered both theoretically and experimentally. The same section topogram exhibits five cases of multiple diffraction at small azimuthal angles for the 400 reflection and MoK{sub α} radiation, while the topogram for the 220 reflection demonstrates two cases of multiple diffraction. All these cases correspond to different combinations of reciprocal lattice vectors. Exact theoretical calculations of section topograms for the aforementioned cases of multiple diffraction have been performed for the first time. The section topograms exhibit two different distortion regions. The distortions in the central region of the structure are fairly complex and depend strongly on the azimuthal angle. In the tails of the multiple diffraction region, there is a shift of two-beam interference fringes, which can be observed even with a laboratory X-ray source.

Authors:
 [1];  [2]
  1. National Research Centre “Kurchatov Institute” (Russian Federation)
  2. Russian Academy of Sciences, Institute of Solid State Physics (Russian Federation)
Publication Date:
OSTI Identifier:
22645446
Resource Type:
Journal Article
Resource Relation:
Journal Name: Crystallography Reports; Journal Volume: 61; Journal Issue: 4; Other Information: Copyright (c) 2016 Pleiades Publishing, Inc.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; INTERFERENCE; MONOCRYSTALS; SILICON; X-RAY DIFFRACTION

Citation Formats

Kohn, V. G., E-mail: kohnvict@yandex.ru, and Smirnova, I. A. Peculiarities of section topograms for the multiple diffraction of X rays. United States: N. p., 2016. Web. doi:10.1134/S1063774516040118.
Kohn, V. G., E-mail: kohnvict@yandex.ru, & Smirnova, I. A. Peculiarities of section topograms for the multiple diffraction of X rays. United States. doi:10.1134/S1063774516040118.
Kohn, V. G., E-mail: kohnvict@yandex.ru, and Smirnova, I. A. Fri . "Peculiarities of section topograms for the multiple diffraction of X rays". United States. doi:10.1134/S1063774516040118.
@article{osti_22645446,
title = {Peculiarities of section topograms for the multiple diffraction of X rays},
author = {Kohn, V. G., E-mail: kohnvict@yandex.ru and Smirnova, I. A.},
abstractNote = {The distortion of interference fringes on the section topograms of single crystal due to the multiple diffraction of X rays has been investigated. The cases of the 220 and 400 reflections in a silicon crystal in the form of a plate with a surface oriented normally to the [001] direction are considered both theoretically and experimentally. The same section topogram exhibits five cases of multiple diffraction at small azimuthal angles for the 400 reflection and MoK{sub α} radiation, while the topogram for the 220 reflection demonstrates two cases of multiple diffraction. All these cases correspond to different combinations of reciprocal lattice vectors. Exact theoretical calculations of section topograms for the aforementioned cases of multiple diffraction have been performed for the first time. The section topograms exhibit two different distortion regions. The distortions in the central region of the structure are fairly complex and depend strongly on the azimuthal angle. In the tails of the multiple diffraction region, there is a shift of two-beam interference fringes, which can be observed even with a laboratory X-ray source.},
doi = {10.1134/S1063774516040118},
journal = {Crystallography Reports},
number = 4,
volume = 61,
place = {United States},
year = {Fri Jul 15 00:00:00 EDT 2016},
month = {Fri Jul 15 00:00:00 EDT 2016}
}