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Title: SU-C-BRC-07: Parametrized GPU Accelerated Electron Monte Carlo Second Check

Journal Article · · Medical Physics
DOI:https://doi.org/10.1118/1.4955554· OSTI ID:22624318
 [1]
  1. Mercy Health Partners, Muskegon, MI (United States)

Purpose: I am presenting a parameterized 3D GPU accelerated electron Monte Carlo second check program. Method: I wrote the 3D grid dose calculation algorithm in CUDA and utilized an NVIDIA GeForce GTX 780 Ti to run all of the calculations. The electron path beyond the distal end of the cone is governed by four parameters: the amplitude of scattering (AMP), the mean and width of a Gaussian energy distribution (E and α), and the percentage of photons. In my code, I adjusted all parameters until the calculated PDD and profile fit the measured 10×10 open beam data within 1%/1mm. I then wrote a user interface for reading the DICOM treatment plan and images in Python. In order to verify the algorithm, I calculated 3D dose distributions on a variety of phantoms and geometries, and compared them with the Eclipse eMC calculations. I also calculated several patient specific dose distributions, including a nose and an ear. Finally, I compared my algorithm’s computation times to Eclipse’s. Results: The calculated MU for all of the investigated geometries agree with the TPS within the TG-114 action level of 5%. The MU for the nose was < 0.5 % different while the MU for the ear at 105 SSD was ∼2 %. Calculation times for a 12MeV 10×10 open beam ranged from 1 second for a 2.5 mm grid resolution with ∼15 million particles to 33 seconds on a 1 mm grid with ∼460 million particles. Eclipse calculation runtimes distributed over 10 FAS workers were 9 seconds to 15 minutes respectively. Conclusion: The GPU accelerated second check allows quick MU verification while accounting for patient specific geometry and heterogeneity.

OSTI ID:
22624318
Journal Information:
Medical Physics, Vol. 43, Issue 6; Other Information: (c) 2016 American Association of Physicists in Medicine; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-2405
Country of Publication:
United States
Language:
English