Time-of-flight measurements of heavy ions using Si PIN diodes

Journal Article · Thu Dec 15 00:00:00 EST 2016 · Physics of Atomic Nuclei

DOI:https://doi.org/10.1134/S1063778816090131· OSTI ID:22614033

Kamanin, D. V. ^[1]; Pyatkov, Yu. V. ^[2]; Kondratyev, N. A.; Zhuchko, V. E. ^[1]; Ilić, S. ^[3]; Alexandrov, A. A.; Alexandrova, I. A. ^[1]; Jacobs, N. ^[4]; Kuznetsova, E. A.; Mishinsky, G. V.; Strekalovsky, O. V. ^[1]

---

1. Joint Institute for Nuclear Research (Russian Federation)
2. National Nuclear Research University MEPhI (Moscow Engineering Physics Institute) (Russian Federation)
3. University of Novi Sad (Serbia)
4. University of Stellenbosch, Faculty of Military Science, Military Academy (South Africa)

A new off-line timing method for PIN diode signals is presented which allows the plasma delay effect to be suppressed. Velocities of heavy ions measured by the new method are in good agreement within a wide range of masses and energies with velocities measured by time stamp detectors based on microchannel plates.

• OSTI ID: 22614033
• Journal Information: Physics of Atomic Nuclei, Vol. 79, Issue 9-10; Other Information: Copyright (c) 2016 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7788
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
HEAVY IONS
MASS
MICROCHANNEL ELECTRON MULTIPLIERS
PLASMA
SEMICONDUCTOR DIODES
SIGNALS
TIME-OF-FLIGHT METHOD
VELOCITY