skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Structural and dielectric properties of La and Ni-doped M-type BaFe{sub 12}O{sub 19} ceramics

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.4948176· OSTI ID:22608878
;  [1]; ;  [2];  [3]
  1. School of Physics, Devi Ahilya University, Khandwa Road Campus, Indore 452001 (India)
  2. Department of Physics, Southeast University, Nanjing, 211189 – People’s Republic of China (China)
  3. Department of Physics, S. N. College, Khandwa, M.P. - India (India)

BaFe{sub 12}O{sub 19} and Ba{sub 0.98}La{sub 0.02}Fe{sub 12-x}Ni{sub x}O{sub 19} (x = 0.02, 0.05) samples synthesized using solid-state reaction route crystallizes in hexagonal structure with space group P6{sub 3}/mmc as revealed from X-ray diffraction. A Raman spectrum shows seven strong and sharp modes at 291.9 (A{sub 1g}), 410.4 (E{sub 2g}), 496.09 (A{sub 1g}), 611.3 (E{sub 2g}), 681(A{sub 1g}), 1048.0 (A{sub 1g}+A{sub 1g}) and 1313.3 cm{sup −1} (A{sub 1g}+E{sub 2g}), identifying the presence of barium hexaferrite phase. The higher values of the dielectric constant at lower frequency and lower values at higher frequency indicate the dispersion due to interfacial polarization. Dielectric constant decreases as the doping concentration of Ni increases due to increase in band gap. A resonance peak has been observed in all three sample and is attributed to the fact that hopping frequency of charge carrier matches well with the frequency of the applied field. Henceforth, Ba{sub 0.98}La{sub 0.02}Fe{sub 12-x}Ni{sub x}O{sub 19} (x = 0.02, 0.05) is suitable novel materials for microwave application with low dielectric constant and dielectric loss values.

OSTI ID:
22608878
Journal Information:
AIP Conference Proceedings, Vol. 1731, Issue 1; Conference: DAE solid state physics symposium 2015, Uttar Pradesh (India), 21-25 Dec 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English