Enhanced dielectric, impedance and magnetic characteristics of Co doped multiferroic Bi{sub 2}Fe{sub 4}O{sub 9}

Journal Article · Mon May 23 00:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4948056· OSTI ID:22608799

Sahu, B.; Singh, A. K. ^[1]; Kaushik, S. D. ^[2]

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1. Department of Physics and Astronomy, National Institute of Technology, Rourkela-769008, Odisha (India)
2. UGC-DAE Consortium for Scientific Research Mumbai Centre, R-5 Shed, BARC, Mumbai-400085 (India)

Multiferroic Bi{sub 2}Fe{sub 4(1-x)}Co{sub 4x}O{sub 9} (x = 0, 0.05) were prepared by conventional solid state reaction route. X-ray diffraction (XRD) result indicated the decrease in lattice parameters due to 5% Co doping. Grain growth in the doped composition was confirmed from surface morphology characterization. Frequency dependent real part of dielectric constant (ε′) at room temperature showed an enhancement of ~70% in doped sample at 1 kHz. A decrease in peak height with doping was noticed from the modulus study. Lastly, room temperature M-H measurement upto 9 T showed induced ferromagnetism in Bi{sub 2}Fe{sub 4}O{sub 9} due to 5% Co doping. The values of remnant magnetization (M{sub r}) and coercive field (H{sub c}) in Bi{sub 2}Fe{sub 3.8}Co{sub 0.2}O{sub 9} was found to be 0.007 µ{sub B}/f.u. and 0.295 kOe respectively.

• OSTI ID: 22608799
• Journal Information: AIP Conference Proceedings, Vol. 1731, Issue 1; Conference: DAE solid state physics symposium 2015, Uttar Pradesh (India), 21-25 Dec 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BISMUTH COMPOUNDS
COBALT ADDITIONS
DIELECTRIC MATERIALS
DIELECTRIC PROPERTIES
DOPED MATERIALS
ELECTRICAL PROPERTIES
FERRITES
FERROMAGNETISM
FREQUENCY DEPENDENCE
GRAIN GROWTH
LATTICE PARAMETERS
MAGNETIC PROPERTIES
MAGNETIZATION
PERMITTIVITY
SOLIDS
SURFACES
TEMPERATURE RANGE 0273-0400 K
X-RAY DIFFRACTION