Structural and magnetic analysis of Cu, Co substituted NiFe{sub 2}O{sub 4} thin films

Journal Article · Mon May 23 00:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4947924· OSTI ID:22608696

Sharma, Hakikat; Bala, Kanchan; Negi, N. S. ^[1]

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1. Department of physics Himachal Pradesh University Shimla (H.P.) India (India)

In the present work we prepared NiFe{sub 2}O{sub 4}, Ni{sub 0.95}Cu{sub 0.05}Fe{sub 2}O{sub 4} and Ni{sub 0.94}Cu{sub 0.05}Co{sub 0.01} Fe{sub 2}O{sub 4} thin films by metallo-organic decomposition method (MOD) using spin coating technique. The thin films were analyzed by X-ray diffractometer (XRD) and Atomic force microscope (AFM) for structural studies. The XRD patterns confirmed the ferrite phase of thin films. From AFM, we analyzed surface morphology, calculated grain size (GS) and root mean square roughness (RMSR). Room temperature magnetic properties were investigated by vibrating sample magnetometer (VSM).

• OSTI ID: 22608696
• Journal Information: AIP Conference Proceedings, Vol. 1731, Issue 1; Conference: DAE solid state physics symposium 2015, Uttar Pradesh (India), 21-25 Dec 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ATOMIC FORCE MICROSCOPY
COBALT ADDITIONS
COPPER ADDITIONS
DECOMPOSITION
FERRITES
GRAIN SIZE
MAGNETIC PROPERTIES
NICKEL COMPOUNDS
ROUGHNESS
SPIN
SPIN-ON COATING
SURFACES
TEMPERATURE RANGE 0273-0400 K
THIN FILMS
VIBRATING SAMPLE MAGNETOMETERS
X-RAY DIFFRACTION
X-RAY DIFFRACTOMETERS