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Title: Effect of thermal implying during ageing process of nanorods growth on the properties of zinc oxide nanorod arrays

Abstract

Undoped and Sn-doped Zinc oxide (ZnO) nanostructures have been fabricated using a simple sol-gel immersion method at 95°C of growth temperature. Thermal sourced by hot plate stirrer was supplied to the solution during ageing process of nanorods growth. The results showed significant decrement in the quality of layer produced after the immersion process where the conductivity and porosity of the samples reduced significantly due to the thermal appliance. The structural properties of the samples have been characterized using field emission scanning electron microscopy (FESEM) electrical properties has been characterized using current voltage (I-V) measurement.

Authors:
; ;  [1];  [2]; ; ;  [1]
  1. NANO-ElecTronic Centre (NET), Faculty of Electrical Engineering, Universiti Teknologi MARA (UiTM), 40450 Shah Alam, Selangor (Malaysia)
  2. (NST), Institute of Science (IOS), Universiti Teknologi MARA - UiTM, 40450 Shah Alam, Selangor (Malaysia)
Publication Date:
OSTI Identifier:
22608578
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1733; Journal Issue: 1; Conference: IC-NET 2015: International conference on nano-electronic technology devices and materials 2015, Selangor (Malaysia), 27 Feb - 2 Mar 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; APPLIANCES; AVAILABILITY; CURRENTS; DOPED MATERIALS; ELECTRICAL PROPERTIES; FIELD EMISSION; LAYERS; NANOSTRUCTURES; POROSITY; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; TIN ADDITIONS; ZINC; ZINC OXIDES

Citation Formats

Ismail, A. S., E-mail: kyrin-samaxi@yahoo.com, Mamat, M. H., E-mail: mhmamat@salam.uitm.edu.my, Rusop, M., E-mail: rusop@salam.uitm.my, NANO-SciTech Centre, Malek, M. F., E-mail: firz-solarzelle@yahoo.com, Abdullah, M. A. R., E-mail: ameerridhwan89@gmail.com, and Sin, M. D., E-mail: diyana0366@johor.uitm.edu.my. Effect of thermal implying during ageing process of nanorods growth on the properties of zinc oxide nanorod arrays. United States: N. p., 2016. Web. doi:10.1063/1.4948827.
Ismail, A. S., E-mail: kyrin-samaxi@yahoo.com, Mamat, M. H., E-mail: mhmamat@salam.uitm.edu.my, Rusop, M., E-mail: rusop@salam.uitm.my, NANO-SciTech Centre, Malek, M. F., E-mail: firz-solarzelle@yahoo.com, Abdullah, M. A. R., E-mail: ameerridhwan89@gmail.com, & Sin, M. D., E-mail: diyana0366@johor.uitm.edu.my. Effect of thermal implying during ageing process of nanorods growth on the properties of zinc oxide nanorod arrays. United States. doi:10.1063/1.4948827.
Ismail, A. S., E-mail: kyrin-samaxi@yahoo.com, Mamat, M. H., E-mail: mhmamat@salam.uitm.edu.my, Rusop, M., E-mail: rusop@salam.uitm.my, NANO-SciTech Centre, Malek, M. F., E-mail: firz-solarzelle@yahoo.com, Abdullah, M. A. R., E-mail: ameerridhwan89@gmail.com, and Sin, M. D., E-mail: diyana0366@johor.uitm.edu.my. Wed . "Effect of thermal implying during ageing process of nanorods growth on the properties of zinc oxide nanorod arrays". United States. doi:10.1063/1.4948827.
@article{osti_22608578,
title = {Effect of thermal implying during ageing process of nanorods growth on the properties of zinc oxide nanorod arrays},
author = {Ismail, A. S., E-mail: kyrin-samaxi@yahoo.com and Mamat, M. H., E-mail: mhmamat@salam.uitm.edu.my and Rusop, M., E-mail: rusop@salam.uitm.my and NANO-SciTech Centre and Malek, M. F., E-mail: firz-solarzelle@yahoo.com and Abdullah, M. A. R., E-mail: ameerridhwan89@gmail.com and Sin, M. D., E-mail: diyana0366@johor.uitm.edu.my},
abstractNote = {Undoped and Sn-doped Zinc oxide (ZnO) nanostructures have been fabricated using a simple sol-gel immersion method at 95°C of growth temperature. Thermal sourced by hot plate stirrer was supplied to the solution during ageing process of nanorods growth. The results showed significant decrement in the quality of layer produced after the immersion process where the conductivity and porosity of the samples reduced significantly due to the thermal appliance. The structural properties of the samples have been characterized using field emission scanning electron microscopy (FESEM) electrical properties has been characterized using current voltage (I-V) measurement.},
doi = {10.1063/1.4948827},
journal = {AIP Conference Proceedings},
number = 1,
volume = 1733,
place = {United States},
year = {Wed Jul 06 00:00:00 EDT 2016},
month = {Wed Jul 06 00:00:00 EDT 2016}
}