Newly designed double surface bimorph mirror for BL-15A of the photon factory

Journal Article · Wed Jul 27 00:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4952893· OSTI ID:22608405

Igarashi, Noriyuki; Nitani, Hiroaki; Takeichi, Yasuo; Niwa, Yasuhiro; Abe, Hitoshi; Kimura, Masao; Mori, Takeharu; Nagatani, Yasuko; Kosuge, Takashi; Kamijo, Ai; Koyama, Atsushi; Shimizu, Nobutaka ^[1]; Ohta, Hiromasa ^[2]

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1. Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization 1-1 Oho, Tsukuba, Ibaraki 305-0801 (Japan)
2. Mitsubishi Electric System & Service Co., Ltd. 20F Carrot Tower 4-1-1 Taishido, Setagaya-ku, Tokyo 154-8520 (Japan)

BL-15A is a new x-ray undulator beamline at the Photon Factory. It will be dedicated to two independent research activities, simultaneous XAFS/XRF/XRD experiments, and SAXS/WAXS/GI-SAXS studies. In order to supply a choice of micro-focus, low-divergence and collimated beams, a double surface bimorph mirror was recently developed. To achieve further mirror surface optimization, the pencil beam scanning method was applied for “in-situ” beam inspection and the Inverse Matrix method was used for determination of optimal voltages on the piezoelectric actuators. The corrected beam profiles at every focal spot gave good agreement with the theoretical values and the resultant beam performance is promising for both techniques. Quick and stable switching between highly focused and intense collimated beams was established using this new mirror with the simple motorized stages.

• OSTI ID: 22608405
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1741; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ABSORPTION SPECTROSCOPY
ACTUATORS
BEAM PROFILES
BEAMS
DESIGN
ELECTRIC POTENTIAL
FINE STRUCTURE
INSPECTION
MIRRORS
OPTIMIZATION
PHOTONS
PIEZOELECTRICITY
SMALL ANGLE SCATTERING
SURFACES
WIGGLER MAGNETS
X RADIATION
X-RAY DIFFRACTION
X-RAY FLUORESCENCE ANALYSIS
X-RAY SPECTROSCOPY