Thickness dependent optical and electrical properties of CdSe thin films

Journal Article · Fri May 06 00:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4946642· OSTI ID:22606618

Chander, S. ^[1]; Nehra, S. P. ^[2]; Lal, C. ^[3]; Dhaka, M. S. ^[1]

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1. Department of Physics, Mohanlal Sukhadia University, Udaipur-313001 (India)
2. Centre of Excellence for Energy and Environmental Studies, Deenbandhu Chhotu Ram University of Science and Technology, Murthal, Sonepat-131039 (India)
3. Department of Physics, University of Rajasthan, Jaipur-302001 (India)

The effect of thickness on the optical and electrical properties of CdSe thin films is investigated in this paper. The films of thickness 445 nm, 631 nm and 810 nm were deposited on glass and ITO coated glass substrates using thermal evaporation technique. The deposited thin films were thermally annealed in air atmosphere at temperature 100°C and were subjected to UV-Vis spectrophotometer and source meter for optical and electrical analysis respectively. The absorption coefficient is observed to increase with photon energy and found maximum in higher photon energy region. The extinction coefficient and refractive index are also calculated. The electrical analysis shows that the electrical resistivity is observed to be decreased with thickness.

• OSTI ID: 22606618
• Journal Information: AIP Conference Proceedings, Vol. 1728, Issue 1; Conference: ICC 2015: International conference on condensed matter and applied physics, Bikaner (India), 30-31 Oct 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION
ANNEALING
CADMIUM SELENIDES
ELECTRIC CONDUCTIVITY
EVAPORATION
GLASS
OPTICAL PROPERTIES
PHOTONS
REFRACTIVE INDEX
SPECTROPHOTOMETERS
SUBSTRATES
THICKNESS
THIN FILMS