Effects of Ti doping on the dielectric properties of HfO{sub 2} nanoparticles

Journal Article · Fri May 06 00:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4946508· OSTI ID:22606526

Pokhriyal, S.

We report the effects of Ti doping on the dielectric properties of HfO{sub 2} [Hf{sub 1-x}Ti{sub x}O{sub 2} (x = 0.2-0.8)] nanoparticles at room temperature. The Hf{sub 1-x}Ti{sub x}O{sub 2} nanoparticles were synthesized by a wet chemical process. The structural and morphological properties of the derived samples were analyzed with X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FTIR) and high resolution transmission electron microscopy (HRTEM). Impedance analysis was performed in pelletized samples in the frequency range of 1 MHz to 1 GHz. The obtained results were analyzed in correlation with microstructure and doping concentration in the derived samples. The average size of the Hf{sub 1-x}Ti{sub x}O{sub 2} nanoparticles is typically in the range of 4-8 nm depending on the processing temperature. The Hf{sub 1−x}Ti{sub x}O{sub 2} nanoparticles show reduction in crystallinity with the increase in Ti doping. The dielectric constants of the derived samples decrease with the increase in frequency. The ac-conductivity in the samples increases with the increase in frequency irrespective of Ti concentration and shows significant drop with the increase in Ti concentration at all frequencies.

• OSTI ID: 22606526
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1728; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

77 NANOSCIENCE AND NANOTECHNOLOGY
CONCENTRATION RATIO
CORRELATIONS
DIELECTRIC MATERIALS
FOURIER TRANSFORM SPECTROMETERS
FOURIER TRANSFORMATION
HAFNIUM OXIDES
HYDROFLUORIC ACID
IMPEDANCE
INFRARED SPECTRA
MICROSTRUCTURE
NANOPARTICLES
PERMITTIVITY
RESOLUTION
TEMPERATURE RANGE 0273-0400 K
TITANIUM ADDITIONS
TRANSMISSION
TRANSMISSION ELECTRON MICROSCOPY
X RADIATION
X-RAY DIFFRACTION