Dielectric relaxation studies in Se{sub 90}Cd{sub 8}Sb{sub 2} glassy alloy

Journal Article · Fri May 06 00:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4946434· OSTI ID:22606475

Shukla, Nitesh; Rao, Vandita; Dwivedi, D. K. ^[1]

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1. Amorphous Semiconductor Research Lab Department of Physics, Madan Mohan Malaviya University of Technology, Gorakhpur-273010 (India)

Se{sub 90}Cd{sub 8}Sb{sub 2} chalcogenide semiconducting alloy was prepared by melt quench technique. The prepared glassy alloy has been characterized by techniques such as scanning electron microscopy (SEM) and energy dispersive X-ray (EDAX).Dielectric properties of Se{sub 90}Cd{sub 8}Sb{sub 2} chalcogenide semiconductor have been studied using impedance spectroscopic technique in the frequency range 5×10{sup 2}Hz - 1×10{sup 5}Hz and in temperature range 303-318K. It is found that dielectric constant ε′ and dielectric loss factor ε″ are dependent on frequency and temperature.

• OSTI ID: 22606475
• Journal Information: AIP Conference Proceedings, Vol. 1728, Issue 1; Conference: ICC 2015: International conference on condensed matter and applied physics, Bikaner (India), 30-31 Oct 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALLOYS
ANTIMONY COMPOUNDS
CADMIUM COMPOUNDS
CHALCOGENIDES
DIELECTRIC MATERIALS
ELECTRON SCANNING
FREQUENCY RANGE
METALLIC GLASSES
PERMITTIVITY
RELAXATION
SCANNING ELECTRON MICROSCOPY
SELENIUM COMPOUNDS
SEMICONDUCTOR MATERIALS
X RADIATION