Polycrystalline BiFeO{sub 3} thin film synthesized via sol-gel assisted spin coating technique for photosensitive application
                            Journal Article
                            ·
                            
                            · AIP Conference Proceedings
                            
                        
                    - Thin Films and Devices Laboratory, School of Physical Sciences, Swami Ramanand Teerth Marathwada University, Nanded – 431606 (India)
- Department of Physics, Savitribai Phule Pune University, Pune – 411007 (India)
We are reporting photosensitivity property of BiFeO{sub 3} thin film under optical illumination. The thin film used for photosensitivity work was fabricated via sol-gel assisted spin coating technique. I-V measurements on the Cu/BiFeO{sub 3}/Al structure under dark condition show a good rectifying property and show dramatic blue shit in threshold voltage under optical illumination. The microstructure, morphology and elemental analysis of the films were characterized by using XRD, UV-Vis, FTIR, SEM and EDS.
- OSTI ID:
- 22606436
- Journal Information:
- AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1728; ISSN APCPCS; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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                                                75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALUMINIUM
BISMUTH COMPOUNDS
COPPER
ELECTRIC CONDUCTIVITY
FERRITES
FOURIER TRANSFORMATION
INFRARED SPECTRA
MICROSTRUCTURE
PHOTOSENSITIVITY
POLYCRYSTALS
SCANNING ELECTRON MICROSCOPY
SOL-GEL PROCESS
SPIN-ON COATING
THIN FILMS
X-RAY DIFFRACTION
                                            
                                        
                                    
                                
                            
                        SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALUMINIUM
BISMUTH COMPOUNDS
COPPER
ELECTRIC CONDUCTIVITY
FERRITES
FOURIER TRANSFORMATION
INFRARED SPECTRA
MICROSTRUCTURE
PHOTOSENSITIVITY
POLYCRYSTALS
SCANNING ELECTRON MICROSCOPY
SOL-GEL PROCESS
SPIN-ON COATING
THIN FILMS
X-RAY DIFFRACTION