Synthesis and characterization of CdSe quantum dots dispersed in PVA matrix by chemical route
Journal Article
·
· AIP Conference Proceedings
- Department of Physics St. Andrews College, Gorakhpur-273001,U.P,-India (India)
CdSe quantum dots using polyvinyl alcohol as a capping agent have been synthesized via a simple heat induced thermolysis technique. The structural analysis of CdSe/PVA thin film was studied by X-ray diffraction, which confirms crystalline nature of the prepared film. The surface morphology and particle size of the prepared sample was studied by Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM). The SEM studies of CdSe/PVA thin film shows the average size of particles in the form of clusters of several quantum dots in the range of 10-20 nm. The morphology of CdSe/PVA thin film was further examined by TEM. The TEM image shows the fringes of tiny dots with average sizes of 4-7 nm. The optical properties of CdSe/PVA thin film were studied by UV-VIS absorption spectroscopy. The CdSe/PVA quantum dots follow the role of direct transition and the optical band gap is found to be 4.03 eV. From dc conductivity measurement, the observed value of activation energy was found to be 0.71 eV.
- OSTI ID:
- 22606307
- Journal Information:
- AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1731; ISSN APCPCS; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION
ABSORPTION SPECTROSCOPY
ACTIVATION ENERGY
CADMIUM SELENIDES
OPTICAL PROPERTIES
PARTICLE SIZE
PVA
QUANTUM DOTS
SCANNING ELECTRON MICROSCOPY
SURFACES
SYNTHESIS
THIN FILMS
TRANSMISSION
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION
ABSORPTION SPECTROSCOPY
ACTIVATION ENERGY
CADMIUM SELENIDES
OPTICAL PROPERTIES
PARTICLE SIZE
PVA
QUANTUM DOTS
SCANNING ELECTRON MICROSCOPY
SURFACES
SYNTHESIS
THIN FILMS
TRANSMISSION
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION