Development of Compton X-ray spectrometer for high energy resolution single-shot high-flux hard X-ray spectroscopy

Journal Article · Fri Apr 15 00:00:00 EDT 2016 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4944864· OSTI ID:22597125

Kojima, Sadaoki; Ikenouchi, Takahito; Arikawa, Yasunobu; Sakata, Shohei; Zhang, Zhe; Abe, Yuki; Nakai, Mitsuo; Nishimura, Hiroaki; Shiraga, Hiroyuki; Fujioka, Shinsuke; Azechi, Hiroshi ^[1]; Ozaki, Tetsuo ^[2]; Miyamoto, Shuji; Yamaguchi, Masashi; Takemoto, Akinori ^[3]

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1. Institute of Laser Engineering, Osaka University, 2-6 Yamada-oka, Suita, Osaka 565-0871 (Japan)
2. National Institute for Fusion Science, 322-6 Oroshi, Toki, Gifu 509-5292 (Japan)
3. Laboratory of Advanced Science and Technology for Industry, University of Hyogo, 3-1-2 Kouto, Kamigori-cho, Ako-gun, Hyogo 678-1205 (Japan)

Hard X-ray spectroscopy is an essential diagnostics used to understand physical processes that take place in high energy density plasmas produced by intense laser-plasma interactions. A bundle of hard X-ray detectors, of which the responses have different energy thresholds, is used as a conventional single-shot spectrometer for high-flux (>10{sup 13} photons/shot) hard X-rays. However, high energy resolution (Δhv/hv < 0.1) is not achievable with a differential energy threshold (DET) X-ray spectrometer because its energy resolution is limited by energy differences between the response thresholds. Experimental demonstration of a Compton X-ray spectrometer has already been performed for obtaining higher energy resolution than that of DET spectrometers. In this paper, we describe design details of the Compton X-ray spectrometer, especially dependence of energy resolution and absolute response on photon-electron converter design and its background reduction scheme, and also its application to the laser-plasma interaction experiment. The developed spectrometer was used for spectroscopy of bremsstrahlung X-rays generated by intense laser-plasma interactions using a 200 μm thickness SiO{sub 2} converter. The X-ray spectrum obtained with the Compton X-ray spectrometer is consistent with that obtained with a DET X-ray spectrometer, furthermore higher certainly of a spectral intensity is obtained with the Compton X-ray spectrometer than that with the DET X-ray spectrometer in the photon energy range above 5 MeV.

• OSTI ID: 22597125
• Journal Information: Review of Scientific Instruments, Vol. 87, Issue 4; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BREMSSTRAHLUNG
COMPTON EFFECT
ELECTRONS
ENERGY DENSITY
ENERGY RESOLUTION
HARD X RADIATION
INTERACTIONS
LASERS
MEV RANGE 01-10
PHOTONS
PLASMA DENSITY
SILICA
SILICON OXIDES
THICKNESS
X-RAY SPECTRA
X-RAY SPECTROMETERS
X-RAY SPECTROSCOPY