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Title: Validation of modelled imaging plates sensitivity to 1-100 keV x-rays and spatial resolution characterisation for diagnostics for the “PETawatt Aquitaine Laser”

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.4944863· OSTI ID:22597117
; ; ; ; ;  [1]; ; ;  [2];  [3];  [4];  [5]; ; ; ;  [6]; ;  [7]
  1. Université de Bordeaux, CNRS, CEA, CELIA (Centre Lasers Intenses et Applications), UMR 5107, F-33405 Talence (France)
  2. CEA DAM DIF, F-91297 Arpajon (France)
  3. Institute of Plasma Physics and Laser Microfusion, Hery Street 23, 01-497 Warsaw (Poland)
  4. Theiss Research, 7411 Eads Avenue, La Jolla, California 92037 (United States)
  5. LULI, Ecole Polytechnique, CNRS, CEA, UPMC, 91128 Palaiseau (France)
  6. ENEA for EUROfusion, Via E. Fermi 45, 00044 Frascati, Rome (Italy)
  7. CEA DAM CESTA, BP 12, F-33405 Le Barp (France)

Thanks to their high dynamic range and ability to withstand electromagnetic pulse, imaging plates (IPs) are commonly used as passive detectors in laser-plasma experiments. In the framework of the development of the diagnostics for the Petawatt Aquitaine Laser facility, we present an absolute calibration and spatial resolution study of five different available types of IP (namely, MS-SR-TR-MP-ND) performed by using laser-induced K-shell X-rays emitted by a solid silver target irradiated by the laser ECLIPSE at CEntre Lasers Intenses et Applications. In addition, IP sensitivity measurements were performed with a 160 kV X-ray generator at CEA DAM DIF, where the absolute response of IP SR and TR has been calibrated to X-rays in the energy range 8-75 keV with uncertainties of about 15%. Finally, the response functions have been modeled in Monte Carlo GEANT4 simulations in order to reproduce experimental data. Simulations enable extrapolation of the IP response functions to photon energies from 1 keV to 1 GeV, of interest, e.g., for laser-driven radiography.

OSTI ID:
22597117
Journal Information:
Review of Scientific Instruments, Vol. 87, Issue 4; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English